| Aging mechanisms and accelerated lifetime tests for SiC MOSFETs: An overview S Pu, F Yang, BT Vankayalapati, B Akin IEEE Journal of Emerging and Selected Topics in Power Electronics 10 (1 …, 2021 | 56 | 2021 |
| A practical on-board SiC MOSFET condition monitoring technique for aging detection S Pu, F Yang, BT Vankayalapati, E Ugur, C Xu, B Akin IEEE Transactions on Industry Applications 56 (3), 2828-2839, 2020 | 42 | 2020 |
| Temperature-independent gate-oxide degradation monitoring of SiC MOSFETs based on junction capacitances M Farhadi, F Yang, S Pu, BT Vankayalapati, B Akin IEEE Transactions on Power Electronics 36 (7), 8308-8324, 2021 | 39 | 2021 |
| A reconfigurable on-board power converter for electric vehicle with reduced switch count SR Meher, S Banerjee, BT Vankayalapati, RK Singh IEEE Transactions on Vehicular Technology 69 (4), 3760-3772, 2020 | 32 | 2020 |
| A highly scalable, modular test bench architecture for large-scale DC power cycling of SiC MOSFETs: Towards data enabled reliability BT Vankayalapati, F Yang, S Pu, M Farhadi, B Akin IEEE Power Electronics Magazine 8 (1), 39-48, 2021 | 20 | 2021 |
| GaN-based multiple output flyback converter with independently controlled outputs A Sarkar, BT Vankayalapati, S Anand IEEE Transactions on Industrial Electronics 69 (3), 2565-2576, 2021 | 16 | 2021 |
| On-board SiC MOSFET degradation monitoring through readily available inverter current/voltage sensors S Pu, F Yang, E Ugur, BT Vankayalapati, C Xu, B Akin 2019 IEEE Transportation Electrification Conference and Expo (ITEC), 1-5, 2019 | 11 | 2019 |
| Two stage integrated on-board charger for EVs BT Vankayalapati, R Singh, VK Bussa 2018 IEEE International Conference on Industrial Technology (ICIT), 1807-1813, 2018 | 11 | 2018 |
| Investigation and on-board detection of gate-open failure in SiC MOSFETs BT Vankayalapati, S Pu, F Yang, M Farhadi, V Gurusamy, B Akin IEEE Transactions on Power Electronics 37 (4), 4658-4671, 2021 | 8 | 2021 |
| A practical switch condition monitoring solution for SiC traction inverters BT Vankayalapati, M Farhadi, R Sajadi, B Akin, H Tan IEEE Journal of Emerging and Selected Topics in Power Electronics 11 (2 …, 2022 | 7 | 2022 |
| A comparative study on reliability and ruggedness of Kelvin and non-Kelvin packaged SiC MOSFETs S Pu, F Yang, N Zhang, BT Vankayalapati, B Akin IEEE Transactions on Industry Applications 58 (3), 3863-3874, 2022 | 7 | 2022 |
| AC Power Cycling Test Setup and Condition Monitoring Tools for SiC-Based Traction Inverters M Farhadi, BT Vankayalapati, R Sajadi, B Akin IEEE Transactions on Vehicular Technology, 2023 | 5 | 2023 |
| Latency compensation of SD-ADC for high performance motor control and diagnosis C Li, B Vankayalapati, B Akin 2021 IEEE 13th International Symposium on Diagnostics for Electrical …, 2021 | 5 | 2021 |
| Gate-oxide degradation monitoring of SiC MOSFETs based on transfer characteristic with temperature compensation M Farhadi, BT Vankayalapati, R Sajadi, B Akin IEEE Transactions on Transportation Electrification, 2023 | 3 | 2023 |
| Analysis and Compensation of Sigma-Delta ADC Latency for High Performance Motor Control and Diagnosis C Li, BT Vankayalapati, B Akin, Z Yu IEEE Transactions on Industry Applications 59 (1), 873-885, 2022 | 3 | 2022 |
| Comparison of Si and GaN power devices based SMPS for satellite application BT Vankayalapati, A Sarkar, R Nune, S Anand, YS Chauhan 2018 IEEE International Conference on Power Electronics, Drives and Energy …, 2018 | 3 | 2018 |
| A Reconfigurable AC Power Cycling Test Setup for Comprehensive Reliability Evaluation of GaN HEMTs C Xu, BT Vankayalapati, F Yang, B Akin IEEE Transactions on Industry Applications 59 (1), 1109-1117, 2022 | 2 | 2022 |
| Methods of monitoring conditions associated with aging of silicon carbide power MOSFET devices in-situ, related circuits and computer program products B Akin, PU Shi, E Ugur, F Yang, C Xu, BT Vankayalapati US Patent 11,397,209, 2022 | 2 | 2022 |
| Closed-loop junction temperature control of SiC MOSFETs in DC power cycling for accurate reliability assessments BT Vankayalapati, B Akin 2021 IEEE 13th International Symposium on Diagnostics for Electrical …, 2021 | 2 | 2021 |
| Systems, circuits, and methods to detect gate-open failures in MOS based insulated gate transistors BT Vankayalapati, B Akin, PU Shi, F Yang, M Farhadi US Patent 11,585,844, 2023 | 1 | 2023 |
Bilal AkinProfessor, University of Texas at DallasVerified email at utdallas.edu
