| Photoluminescence imaging of silicon wafers T Trupke, RA Bardos, MC Schubert, W Warta Applied Physics Letters 89 (4), 044107, 2006 | 711 | 2006 |
| Lock-in thermography: Basics and use for evaluating electronic devices and materials O Breitenstein, W Warta, MC Schubert Springer, 2019 | 368 | 2019 |
| Minority carrier lifetime imaging of silicon wafers calibrated by quasi-steady-state photoluminescence JA Giesecke, MC Schubert, B Michl, F Schindler, W Warta Solar Energy Materials and Solar Cells 95 (3), 1011-1018, 2011 | 156 | 2011 |
| UV degradation and recovery of perovskite solar cells SW Lee, S Kim, S Bae, K Cho, T Chung, LE Mundt, S Lee, S Park, H Park, ... Scientific reports 6 (1), 1-10, 2016 | 151 | 2016 |
| Understanding junction breakdown in multicrystalline solar cells O Breitenstein, J Bauer, K Bothe, W Kwapil, D Lausch, U Rau, J Schmidt, ... Journal of Applied Physics 109 (7), 5, 2011 | 128 | 2011 |
| High-efficiency n-type HP mc silicon solar cells J Benick, A Richter, R Müller, H Hauser, F Feldmann, P Krenckel, S Riepe, ... IEEE journal of photovoltaics 7 (5), 1171-1175, 2017 | 116 | 2017 |
| Trapping artifacts in quasi-steady-state photoluminescence and photoconductance lifetime measurements on silicon wafers RA Bardos, T Trupke, MC Schubert, T Roth Applied Physics Letters 88 (5), 053504, 2006 | 107 | 2006 |
| Effective passivation of black silicon surfaces by atomic layer deposition P Repo, A Haarahiltunen, L Sainiemi, M Yli-Koski, H Talvitie, ... IEEE Journal of Photovoltaics 3 (1), 90-94, 2012 | 98 | 2012 |
| Efficiency limiting bulk recombination in multicrystalline silicon solar cells B Michl, M Rüdiger, JA Giesecke, M Hermle, W Warta, MC Schubert Solar Energy Materials and Solar Cells 98, 441-447, 2012 | 87 | 2012 |
| Analysing the effect of crystal size and structure in highly efficient CH 3 NH 3 PbI 3 perovskite solar cells by spatially resolved photo-and electroluminescence imaging S Mastroianni, FD Heinz, JH Im, W Veurman, M Padilla, MC Schubert, ... Nanoscale 7 (46), 19653-19662, 2015 | 78 | 2015 |
| Impact of the firing temperature profile on light induced degradation of multicrystalline silicon R Eberle, W Kwapil, F Schindler, MC Schubert, SW Glunz physica status solidi (RRL)–Rapid Research Letters 10 (12), 861-865, 2016 | 75 | 2016 |
| Can luminescence imaging replace lock-in thermography on solar cells? O Breitenstein, J Bauer, K Bothe, D Hinken, J Müller, W Kwapil, ... IEEE Journal of Photovoltaics 1 (2), 159-167, 2011 | 74 | 2011 |
| Degradation of crystalline silicon due to boron–oxygen defects T Niewelt, J Schön, W Warta, SW Glunz, MC Schubert IEEE Journal of Photovoltaics 7 (1), 383-398, 2016 | 73 | 2016 |
| Identifying the impact of surface recombination at electrodes in organic solar cells by means of electroluminescence and modeling J Reinhardt, M Grein, C Bühler, M Schubert, U Würfel Advanced Energy Materials 4 (11), 1400081, 2014 | 72 | 2014 |
| N-type black silicon solar cells P Repo, J Benick, V Vähänissi, J Schön, G von Gastrow, B Steinhauser, ... Energy Procedia 38, 866-871, 2013 | 69 | 2013 |
| Observation of metal precipitates at prebreakdown sites in multicrystalline silicon solar cells W Kwapil, P Gundel, MC Schubert, FD Heinz, W Warta, ER Weber, ... Applied Physics Letters 95 (23), 232113, 2009 | 67 | 2009 |
| Quantitative carrier lifetime measurement with micron resolution P Gundel, FD Heinz, MC Schubert, JA Giesecke, W Warta Journal of Applied Physics 108 (3), 033705, 2010 | 65 | 2010 |
| Diode breakdown related to recombination active defects in block-cast multicrystalline silicon solar cells W Kwapil, M Kasemann, P Gundel, MC Schubert, W Warta, P Bronsveld, ... Journal of Applied Physics 106 (6), 063530, 2009 | 65 | 2009 |
| Spatially resolved lifetime imaging of silicon wafers by measurement of infrared emission MC Schubert, J Isenberg, W Warta Journal of Applied Physics 94 (6), 4139-4143, 2003 | 64 | 2003 |
| Short-circuit current density mapping for solar cells M Padilla, B Michl, B Thaidigsmann, W Warta, MC Schubert Solar energy materials and solar cells 120, 282-288, 2014 | 62 | 2014 |
Wilhelm WartaFraunhofer ISEVerified email at ise.fraunhofer.de
