Martin C. Schubert
Martin C. Schubert
Head of Department Quality Assurance, Characterization and Simulation, Fraunhofer ISE
Verified email at ise.fraunhofer.de
Title
Cited by
Cited by
Year
Photoluminescence imaging of silicon wafers
T Trupke, RA Bardos, MC Schubert, W Warta
Applied Physics Letters 89 (4), 044107, 2006
7332006
Lock-in thermography: Basics and use for evaluating electronic devices and materials
O Breitenstein, W Warta, MC Schubert
Springer, 2019
3972019
UV degradation and recovery of perovskite solar cells
SW Lee, S Kim, S Bae, K Cho, T Chung, LE Mundt, S Lee, S Park, H Park, ...
Scientific reports 6 (1), 1-10, 2016
1752016
Minority carrier lifetime imaging of silicon wafers calibrated by quasi-steady-state photoluminescence
JA Giesecke, MC Schubert, B Michl, F Schindler, W Warta
Solar Energy Materials and Solar Cells 95 (3), 1011-1018, 2011
1712011
High-efficiency n-type HP mc silicon solar cells
J Benick, A Richter, R Müller, H Hauser, F Feldmann, P Krenckel, S Riepe, ...
IEEE journal of photovoltaics 7 (5), 1171-1175, 2017
1362017
Understanding junction breakdown in multicrystalline solar cells
O Breitenstein, J Bauer, K Bothe, W Kwapil, D Lausch, U Rau, J Schmidt, ...
Journal of Applied Physics 109 (7), 5, 2011
1342011
Trapping artifacts in quasi-steady-state photoluminescence and photoconductance lifetime measurements on silicon wafers
RA Bardos, T Trupke, MC Schubert, T Roth
Applied Physics Letters 88 (5), 053504, 2006
1142006
Effective passivation of black silicon surfaces by atomic layer deposition
P Repo, A Haarahiltunen, L Sainiemi, M Yli-Koski, H Talvitie, ...
IEEE Journal of Photovoltaics 3 (1), 90-94, 2012
1082012
Degradation of crystalline silicon due to boron–oxygen defects
T Niewelt, J Schön, W Warta, SW Glunz, MC Schubert
IEEE Journal of Photovoltaics 7 (1), 383-398, 2016
1002016
Impact of the firing temperature profile on light induced degradation of multicrystalline silicon
R Eberle, W Kwapil, F Schindler, MC Schubert, SW Glunz
physica status solidi (RRL)–Rapid Research Letters 10 (12), 861-865, 2016
902016
Efficiency limiting bulk recombination in multicrystalline silicon solar cells
B Michl, M Rüdiger, JA Giesecke, M Hermle, W Warta, MC Schubert
Solar Energy Materials and Solar Cells 98, 441-447, 2012
892012
Analysing the effect of crystal size and structure in highly efficient CH 3 NH 3 PbI 3 perovskite solar cells by spatially resolved photo-and electroluminescence imaging
S Mastroianni, FD Heinz, JH Im, W Veurman, M Padilla, MC Schubert, ...
Nanoscale 7 (46), 19653-19662, 2015
812015
Identifying the impact of surface recombination at electrodes in organic solar cells by means of electroluminescence and modeling
J Reinhardt, M Grein, C Bühler, M Schubert, U Würfel
Advanced Energy Materials 4 (11), 1400081, 2014
812014
Can luminescence imaging replace lock-in thermography on solar cells?
O Breitenstein, J Bauer, K Bothe, D Hinken, J Müller, W Kwapil, ...
IEEE Journal of Photovoltaics 1 (2), 159-167, 2011
762011
Understanding the light‐induced degradation at elevated temperatures: Similarities between multicrystalline and floatzone p‐type silicon
T Niewelt, F Schindler, W Kwapil, R Eberle, J Schön, MC Schubert
Progress in Photovoltaics: Research and Applications 26 (8), 533-542, 2018
742018
The concept of skins for silicon solar cell modeling
A Fell, J Schön, MC Schubert, SW Glunz
Solar Energy Materials and Solar Cells 173, 128-133, 2017
722017
N-type black silicon solar cells
P Repo, J Benick, V Vähänissi, J Schön, G von Gastrow, B Steinhauser, ...
Energy Procedia 38, 866-871, 2013
712013
Light-induced activation and deactivation of bulk defects in boron-doped float-zone silicon
T Niewelt, M Selinger, NE Grant, W Kwapil, JD Murphy, MC Schubert
Journal of Applied Physics 121 (18), 185702, 2017
672017
Observation of metal precipitates at prebreakdown sites in multicrystalline silicon solar cells
W Kwapil, P Gundel, MC Schubert, FD Heinz, W Warta, ER Weber, ...
Applied Physics Letters 95 (23), 232113, 2009
672009
Quantitative carrier lifetime measurement with micron resolution
P Gundel, FD Heinz, MC Schubert, JA Giesecke, W Warta
Journal of Applied Physics 108 (3), 033705, 2010
662010
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