| Design and first applications of a post-column imaging filter OL Krivanek, AJ Gubbens, N Dellby, CE Meyer Microscopy Microanalysis Microstructures 3 (2-3), 187-199, 1992 | 183 | 1992 |
| Progress in ultrahigh energy resolution EELS OL Krivanek, N Dellby, JA Hachtel, JC Idrobo, MT Hotz, B Plotkin-Swing, ... Ultramicroscopy 203, 60-67, 2019 | 148 | 2019 |
| Hybrid pixel direct detector for electron energy loss spectroscopy B Plotkin-Swing, GJ Corbin, S De Carlo, N Dellby, C Hoermann, ... Ultramicroscopy 217, 113067, 2020 | 74 | 2020 |
| Slow-scan CCD camera for transmission electron microscopy PE Mooney, GY Fan, CE Meyer, KV Truong, DB Bui, OL Krivanek Proceedings, annual meeting, Electron Microscopy Society of America 48 (1 …, 1990 | 38 | 1990 |
| Nion Swift: Open Source Image Processing Software for Instrument Control, Data Acquisition, Organization, Visualization, and Analysis Using Python. C Meyer, N Dellby, JA Hachtel, T Lovejoy, A Mittelberger, O Krivanek Microscopy and Microanalysis 25 (S2), 122-123, 2019 | 33 | 2019 |
| High-fidelity 4D-STEM enabled by live processing at 15’000 detector frames per second B Haas, A Mittelberger, C Meyer, B Plotkin-Swing, N Dellby, O Krivanek, ... Microscopy and Microanalysis 27 (S1), 994-997, 2021 | 10 | 2021 |
| 100,000 diffraction patterns per second with live processing for 4D-STEM B Plotkin-Swing, B Haas, A Mittelberger, N Dellby, M Hotz, P Hrncirik, ... Microscopy and Microanalysis 28 (S1), 422-424, 2022 | 9 | 2022 |
| Digital Micrograph 2.5. 7 C Meyer, M Leber, O Krivanek Gatan Inc, 1996 | 8 | 1996 |
| Angle-resolved electron energy loss spectroscopy T Lovejoy, B Plotkin-Swing, N Dellby, C Meyer, A Mittelberger, A Eljarrat, ... Microscopy and Microanalysis 26 (S2), 964-965, 2020 | 7 | 2020 |
| 5D-STEM: Live processing and display at 15,000 diffraction patterns per second A Mittelberger, B Haas, B Plotkin-Swing, C Meyer, N Dellby, L Piazza, ... Microscopy and Microanalysis 27 (S1), 1064-1065, 2021 | 5 | 2021 |
| Using Nion Swift for data collection, analysis and display CE Meyer, N Dellby, Z Dellby, TC Lovejoy, MC Sarahan, GS Skone, ... Microscopy and Microanalysis 20 (S3), 1108-1109, 2014 | 5 | 2014 |
| Design and applications of a post-column imaging filter OL Krivanek Proceedings of 50^< th> Annual Meeting of the Electron Microscopy Society of …, 1992 | 5 | 1992 |
| Advances in STEM and EELS: new operation modes, detectors and software AL Bleloch, NJ Bacon, GJ Corbin, N Dellby, MV Hoffman, MT Hotz, ... Microscopy and Microanalysis 25 (S2), 512-513, 2019 | 4 | 2019 |
| Measurement of TEM primary energy with an electron energy-loss spectrometer CE Meyer, CB Boothroyd, AJ Gubbens, OL Krivanek Ultramicroscopy 59 (1-4), 283-285, 1995 | 3 | 1995 |
| Advances in Momentum Resolved EELS B Plotkin-Swing, G Corbin, N Dellby, N Johnson, P Hrncrik, C Meyer, ... Microscopy and Microanalysis 27 (S1), 136-138, 2021 | 2 | 2021 |
| Hybrid pixel EELS detector: Low noise, high speed, and large dynamic range B Plotkin-Swing, T Lovejoy, N Dellby, G Corbin, M Hoffman, S De Carlo, ... Microscopy and Microanalysis 26 (S2), 1928-1930, 2020 | 2 | 2020 |
| Open-Source Python Scripting and Analysis with Nion Swift MF Murfitt, CE Meyer, G Skone, N Dellby, OL Krivanek Microscopy and Microanalysis 19 (S2), 782-783, 2013 | 2 | 2013 |
| Digital Micrograph 2.5. 7: GATAN Inc C Meyer, M Leber, O Krivanek Pleasanton, San Francisco, 1996 | 2 | 1996 |
| 透過電子顕微鏡用スロースキャン CCD カメラ K OL, M PE, R WJ, F GY, M CE, L ML 電子顕微鏡 27 (2), 170-180, 1992 | 2 | 1992 |
| Seamless communication between high-performance computing system and electron microscopes for on-demand automated data transfer and remote control D Mukherjee, A Al-Najjar, KM Roccapriore, JD Hinkle, AR Lupini, C Meyer, ... Microscopy and Microanalysis 28 (S1), 2908-2910, 2022 | 1 | 2022 |
Ondrej KrivanekNion Co., Arizona State U.Verified email at nion.com
