Spin transport, magnetoresistance, and electrically detected magnetic resonance in amorphous hydrogenated silicon nitride MJ Mutch, PM Lenahan, SW King Applied Physics Letters 109 (6), 2016 | 42 | 2016 |
Defect chemistry and electronic transport in low-κ dielectrics studied with electrically detected magnetic resonance MJ Mutch, PM Lenahan, SW King Journal of Applied Physics 119 (9), 2016 | 36 | 2016 |
Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability MJ Mutch, T Pomorski, BC Bittel, CJ Cochrane, PM Lenahan, X Liu, ... Microelectronics Reliability 63, 201-213, 2016 | 24 | 2016 |
Memory cells and methods of forming a capacitor including current leakage paths having different total resistances M Mutch, AA Chavan, S Chhajed, BR Cook, KK Muthukrishnan, ... US Patent 11,170,834, 2021 | 7 | 2021 |
Quantitative electrically detected magnetic resonance for device reliability studies CJ Cochrane, M Anders, M Mutch, P Lenahan 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW), 6-9, 2014 | 4 | 2014 |
Semiconductor structures, memory devices and systems, and methods of forming same AA Chavan, DVN Ramaswamy, M Mutch, S Chhajed US Patent App. 16/122,004, 2020 | 3 | 2020 |
Magnetic Resonance and Magnetoresistance for the Understanding of Defect Chemistry and Spin-Transport in Amorphous Semiconductors and Dielectrics MJ Mutch The Pennsylvania State University, 2017 | 3 | 2017 |
Radiation induced leakage currents in dense and porous low-k dielectrics RJ Waskiewicz, MJ Mutch, PM Lenahan, SW King 2016 IEEE International Integrated Reliability Workshop (IIRW), 99-102, 2016 | 3 | 2016 |
Transistor and methods of forming transistors M Nahar, M Mutch US Patent 10,964,811, 2021 | 1 | 2021 |
Microelectronic devices including capacitors, and related electronic systems and methods SS Kelkar, M Mutch, L Fumagalli, HA Abbas, BD Kraus, D Kim, CW Petz, ... US Patent App. 18/047,978, 2024 | | 2024 |
Memory cells and methods of forming a capacitor including current leakage paths having different total resistances M Mutch, AA Chavan, S Chhajed, BR Cook, KK Muthukrishnan, ... US Patent 11,935,574, 2024 | | 2024 |
Electronic devices comprising crystalline materials and related memory devices and systems AA Chavan, DVN Ramaswamy, M Mutch, S Chhajed US Patent 11,735,416, 2023 | | 2023 |
Semiconductor devices comprising continuous crystalline structures, and related memory devices and systems M Mutch, M Nahar US Patent 11,728,387, 2023 | | 2023 |
Transistor and methods of forming transistors M Nahar, M Mutch US Patent 11,695,071, 2023 | | 2023 |
Devices comprising crystalline materials M Mutch, M Nahar, WI Kinney US Patent App. 18/050,772, 2023 | | 2023 |
Methods of incorporating leaker devices into capacitor configurations to reduce cell disturb, and capacitor configurations incorporating leaker devices M Mutch, SS Kelkar, AA Chavan, S Chhajed, AJJ Jebaraj US Patent 11,587,938, 2023 | | 2023 |
Devices comprising crystalline materials and related systems M Mutch, M Nahar, WI Kinney US Patent 11,532,699, 2022 | | 2022 |
Transistor And Methods Of Forming Transistors M Nahar, VN Antonov, KM Karda, M Mutch, HW Liu, JB Hull US Patent App. 17/860,325, 2022 | | 2022 |
Vertical transistors with channel region having vertically elongated crystal grains that individually are directly against both of the top and bottom source/drain regions M Nahar, VN Antonov, KM Karda, M Mutch, HW Liu, JB Hull US Patent 11,417,730, 2022 | | 2022 |
Methods of forming semiconductor structures M Mutch, M Nahar US Patent 11,018,229, 2021 | | 2021 |