George Papaioannou
George Papaioannou
University of Athens, Solid State Physics Section
Verified email at - Homepage
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Temperature study of the dielectric polarization effects of capacitive RF MEMS switches
G Papaioannou, MN Exarchos, V Theonas, G Wang, J Papapolymerou
IEEE Transactions on Microwave Theory and Techniques 53 (11), 3467-3473, 2005
Foreign takeover activity in the US and wealth effects for target firm shareholders
AS Cebenoyan, GJ Papaioannou, NG Travlos
Financial Management, 58-68, 1992
Market reaction to NYSE listings: Tests of the marketability gains hypothesis
T Grammatikos, G Papaioannou
Journal of Financial Research 9 (3), 215-227, 1986
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation
M Lamhamdi, P Pons, U Zaghloul, L Boudou, F Coccetti, J Guastavino, ...
Microelectronics Reliability 48 (8-9), 1248-1252, 2008
Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions
U Zaghloul, G Papaioannou, F Coccetti, P Pons, R Plana
Microelectronics Reliability 49 (9-11), 1309-1314, 2009
The informational value of listing on the New York Stock Exchange
T Grammatikos, GJ Papaioannou
Financial Review 21 (4), 485-500, 1986
Ownership structure and corporate liquidity policy
GJ Papaioannou, E Strock, NG Travlos
Managerial and decision economics 13 (4), 315-322, 1992
Corporate dividend policy response to the Tax Reform Act of 1986
GJ Papaioannou, CM Savarese
Financial Management, 56-63, 1994
Structure dependent charging process in RF MEMS capacitive switches
E Papandreou, M Lamhamdi, CM Skoulikidou, P Pons, G Papaioannou, ...
Microelectronics Reliability 47 (9-11), 1812-1817, 2007
Effect of deposition conditions on charging processes in SiNx: Application to RF-MEMS capacitive switches
R Daigler, E Papandreou, M Koutsoureli, G Papaioannou, ...
Microelectronic Engineering 86 (3), 404-407, 2009
Dielectric charging in radio frequency microelectromechanical system capacitive switches: A study of material properties and device performance
G Papaioannou, J Papapolymerou, P Pons, R Plana
Applied Physics Letters 90 (23), 233507, 2007
On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization …
U Zaghloul, G Papaioannou, B Bhushan, F Coccetti, P Pons, R Plana
Microelectronics Reliability 51 (9-11), 1810-1818, 2011
On the influence of environment gases, relative humidity and gas purification on dielectric charging/discharging processes in electrostatically driven MEMS/NEMS devices
U Zaghloul, B Bhushan, P Pons, GJ Papaioannou, F Coccetti, R Plana
Nanotechnology 22 (3), 035705, 2010
Valuation effects of Greek stock dividend distributions
GJ Papaioannou, NG Travlos, NV Tsangarakis*
European Financial Management 6 (4), 515-531, 2000
Risk and return on newly listed stocks: The post‐listing experience
A Bhandari, T Grammatikos, AK Makhija, G Papaioannou
Journal of Financial Research 12 (2), 93-102, 1989
Corporate acquisitions: Method of payment effects, capital structure effects, and bidding firms stock returns
NG Travlos, GJ Papaioannou
Quarterly Journal of Business and economics, 3-22, 1991
Contactless dielectric charging mechanisms in RF-MEMS capacitive switches
GJ Papaioannou, G Wang, D Bessas, J Papapolymerou
2006 European Microwave Integrated Circuits Conference, 513-516, 2006
A systematic reliability investigation of the dielectric charging process in electrostatically actuated MEMS based on Kelvin probe force microscopy
U Zaghloul, GJ Papaioannou, F Coccetti, P Pons, R Plana
Journal of Micromechanics and Microengineering 20 (6), 064016, 2010
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques
U Zaghloul, M Koutsoureli, H Wang, F Coccetti, G Papaioannou, P Pons, ...
Microelectronics Reliability 50 (9-11), 1615-1620, 2010
Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches
A Belarni, M Lamhamdi, P Pons, L Boudou, J Guastavino, Y Segui, ...
Microelectronics Reliability 48 (8-9), 1232-1236, 2008
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