| Selective growth of well-aligned semiconducting single-walled carbon nanotubes L Ding, A Tselev, J Wang, D Yuan, H Chu, TP McNicholas, Y Li, J Liu Nano letters 9 (2), 800-805, 2009 | 482 | 2009 |
| Real space mapping of Li-ion transport in amorphous Si anodes with nanometer resolution N Balke, S Jesse, Y Kim, L Adamczyk, A Tselev, IN Ivanov, NJ Dudney, ... Nano letters 10 (9), 3420-3425, 2010 | 256 | 2010 |
| Mechanism of detection in carbon nanotube field effect transistor chemical sensors J Zhang, A Boyd, A Tselev, M Paranjape, P Barbara Applied Physics Letters 88 (12), 123112, 2006 | 199 | 2006 |
| Differentiating ferroelectric and nonferroelectric electromechanical effects with scanning probe microscopy N Balke, P Maksymovych, S Jesse, A Herklotz, A Tselev, CB Eom, ... ACS nano 9 (6), 6484-6492, 2015 | 176 | 2015 |
| Symmetry relationship and strain-induced transitions between insulating M1 and M2 and metallic R phases of vanadium dioxide A Tselev, IA Luk’Yanchuk, IN Ivanov, JD Budai, JZ Tischler, E Strelcov, ... Nano letters 10 (11), 4409-4416, 2010 | 163 | 2010 |
| Doping-Based Stabilization of the M2 Phase in Free-Standing VO2 Nanostructures at Room Temperature E Strelcov, A Tselev, I Ivanov, JD Budai, J Zhang, JZ Tischler, ... Nano Letters 12 (12), 6198-6205, 2012 | 128 | 2012 |
| Evidence for power-law frequency dependence of intrinsic dielectric response in the Ca Cu 3 Ti 4 O 12 A Tselev, CM Brooks, SM Anlage, H Zheng, L Salamanca-Riba, ... Physical Review B 70 (14), 144101, 2004 | 126 | 2004 |
| Interplay of Octahedral Tilts and Polar Order in BiFeO3 Films YM Kim, A Kumar, A Hatt, AN Morozovska, A Tselev, MD Biegalski, ... Advanced Materials 25 (17), 2497-2504, 2013 | 109 | 2013 |
| The role of electrochemical phenomena in scanning probe microscopy of ferroelectric thin films SV Kalinin, S Jesse, A Tselev, AP Baddorf, N Balke Acs Nano 5 (7), 5683-5691, 2011 | 109 | 2011 |
| Nanoscale ferroelectricity in crystalline γ‐glycine A Heredia, V Meunier, IK Bdikin, J Gracio, N Balke, S Jesse, A Tselev, ... Advanced Functional Materials 22 (14), 2996-3003, 2012 | 98 | 2012 |
| Interplay between Ferroelastic and Metal−Insulator Phase Transitions in Strained Quasi-Two-Dimensional VO2 Nanoplatelets A Tselev, E Strelcov, IA Luk’yanchuk, JD Budai, JZ Tischler, IN Ivanov, ... Nano letters 10 (6), 2003-2011, 2010 | 97 | 2010 |
| Big data and deep data in scanning and electron microscopies: deriving functionality from multidimensional data sets A Belianinov, R Vasudevan, E Strelcov, C Steed, SM Yang, A Tselev, ... Advanced Structural and Chemical Imaging 1 (1), 1-25, 2015 | 96 | 2015 |
| Probing charge screening dynamics and electrochemical processes at the solid–liquid interface with electrochemical force microscopy L Collins, S Jesse, JI Kilpatrick, A Tselev, O Varenyk, MB Okatan, ... Nature communications 5 (1), 1-8, 2014 | 78 | 2014 |
| Direct mapping of ionic transport in a Si anode on the nanoscale: time domain electrochemical strain spectroscopy study S Jesse, N Balke, E Eliseev, A Tselev, NJ Dudney, AN Morozovska, ... Acs Nano 5 (12), 9682-9695, 2011 | 66 | 2011 |
| Mesoscopic Metal−Insulator Transition at Ferroelastic Domain Walls in VO2 A Tselev, V Meunier, E Strelcov, WA Shelton Jr, IA Luk’yanchuk, K Jones, ... Acs Nano 4 (8), 4412-4419, 2010 | 66 | 2010 |
| Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy N Balke, S Jesse, P Yu, B Carmichael, SV Kalinin, A Tselev Nanotechnology 27 (42), 425707, 2016 | 64 | 2016 |
| Atomic‐Level Sculpting of Crystalline Oxides: Toward Bulk Nanofabrication with Single Atomic Plane Precision S Jesse, Q He, AR Lupini, DN Leonard, MP Oxley, O Ovchinnikov, ... Small 11 (44), 5895-5900, 2015 | 64 | 2015 |
| Li-ion dynamics and reactivity on the nanoscale S Kalinin, N Balke, S Jesse, A Tselev, A Kumar, TM Arruda, S Guo, ... Materials Today 14 (11), 548-558, 2011 | 64 | 2011 |
| Cross-beam pulsed laser deposition: General characteristic A Tselev, A Gorbunov, W Pompe Review of Scientific Instruments 72 (6), 2665-2672, 2001 | 60 | 2001 |
| Near-field microwave scanning probe imaging of conductivity inhomogeneities in CVD graphene A Tselev, NV Lavrik, I Vlassiouk, DP Briggs, M Rutgers, R Proksch, ... Nanotechnology 23 (38), 385706, 2012 | 59 | 2012 |
Sergei V. KalininOak Ridge National Laboratory, the Center for Nanophase Materials SciencesVerified email at ornl.gov
