| Multilevel HfO2-based RRAM devices for low-power neuromorphic networks V Milo, C Zambelli, P Olivo, E Pérez, M K. Mahadevaiah, O G. Ossorio, ... APL Materials 7 (8), 081120, 2019 | 90 | 2019 |
| Fundamental variability limits of filament-based RRAM A Grossi, E Nowak, C Zambelli, C Pellissier, S Bernasconi, G Cibrario, ... 2016 IEEE International Electron Devices Meeting (IEDM), 4.7. 1-4.7. 4, 2016 | 86 | 2016 |
| Impact of intercell and intracell variability on forming and switching parameters in RRAM arrays A Grossi, D Walczyk, C Zambelli, E Miranda, P Olivo, V Stikanov, A Feriani, ... IEEE Transactions on Electron Devices 62 (8), 2502-2509, 2015 | 59 | 2015 |
| Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms E Pérez, A Grossi, C Zambelli, P Olivo, R Roelofs, C Wenger IEEE Electron Device Letters 38 (2), 175-178, 2016 | 53 | 2016 |
| Experimental investigation of 4-kb RRAM arrays programming conditions suitable for TCAM A Grossi, E Vianello, C Zambelli, P Royer, JP Noel, B Giraud, L Perniola, ... IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (12 …, 2018 | 48 | 2018 |
| Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays A Grossi, C Zambelli, P Olivo, E Miranda, V Stikanov, C Walczyk, ... Solid-State Electronics 115, 17-25, 2016 | 46 | 2016 |
| Architectural and integration options for 3D NAND flash memories R Micheloni, L Crippa, C Zambelli, P Olivo Computers 6 (3), 27, 2017 | 44 | 2017 |
| Nonvolatile memories: Present and future challenges EI Vatajelu, H Aziza, C Zambelli 2014 9th International Design and Test Symposium (IDT), 61-66, 2014 | 43 | 2014 |
| Solid-state drives: Memory driven design methodologies for optimal performance L Zuolo, C Zambelli, R Micheloni, P Olivo Proceedings of the IEEE 105 (9), 1589-1608, 2017 | 40 | 2017 |
| Toward reliable multi-level operation in RRAM arrays: Improving post-algorithm stability and assessing endurance/data retention E Perez, C Zambelli, MK Mahadevaiah, P Olivo, C Wenger IEEE Journal of the Electron Devices Society 7, 740-747, 2019 | 35 | 2019 |
| Resistive RAM endurance: Array-level characterization and correction techniques targeting deep learning applications A Grossi, E Vianello, MM Sabry, M Barlas, L Grenouillet, J Coignus, ... IEEE Transactions on Electron Devices 66 (3), 1281-1288, 2019 | 33 | 2019 |
| Statistical analysis of resistive switching characteristics in ReRAM test arrays C Zambelli, A Grossi, P Olivo, D Walczyk, T Bertaud, B Tillack, ... 2014 International Conference on Microelectronic Test Structures (ICMTS), 27-31, 2014 | 28 | 2014 |
| A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories C Zambelli, M Indaco, M Fabiano, S Di Carlo, P Prinetto, P Olivo, ... 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE), 881-886, 2012 | 28 | 2012 |
| Is consumer electronics redesigning our cars?: Challenges of integrated technologies for sensing, computing, and storage F Pieri, C Zambelli, A Nannini, P Olivo, S Saponara IEEE Consumer Electronics Magazine 7 (5), 8-17, 2018 | 27 | 2018 |
| Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays E Pérez, A Grossi, C Zambelli, P Olivo, C Wenger IEEE Journal of the Electron Devices Society 5 (1), 64-68, 2016 | 26 | 2016 |
| Relationship among current fluctuations during forming, cell-to-cell variability and reliability in RRAM arrays A Grossi, C Zambelli, P Olivo, E Miranda, V Stikanov, T Schroeder, ... 2015 IEEE International Memory Workshop (IMW), 1-4, 2015 | 25 | 2015 |
| Reliability and performance characterization of a MEMS-based non-volatile switch R Gaddi, C Schepens, C Smith, C Zambelli, A Chimenton, P Olivo 2011 International Reliability Physics Symposium, 2G. 2.1-2G. 2.6, 2011 | 25 | 2011 |
| Phase change and magnetic memories for solid-state drive applications C Zambelli, G Navarro, V Sousa, IL Prejbeanu, L Perniola Proceedings of the IEEE 105 (9), 1790-1811, 2017 | 24 | 2017 |
| Characterization of TLC 3D-NAND flash endurance through machine learning for LDPC code rate optimization C Zambelli, G Cancelliere, F Riguzzi, E Lamma, P Olivo, A Marelli, ... 2017 IEEE International Memory Workshop (IMW), 1-4, 2017 | 24 | 2017 |
| SSDExplorer: A virtual platform for performance/reliability-oriented fine-grained design space exploration of solid state drives L Zuolo, C Zambelli, R Micheloni, M Indaco, S Di Carlo, P Prinetto, ... IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 24 | 2015 |
