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Holger Bartolf
Holger Bartolf
Robert Bosch GmbH, Automotive Electronics, Power-Semiconductors Modules (AE/PJ-PSC1)
Verified email at de.bosch.com - Homepage
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Cited by
Year
Optical and transport properties of ultrathin NbN films and nanostructures
A Semenov, B Günther, U Böttger, HW Hübers, H Bartolf, A Engel, ...
Physical Review B 80 (5), 054510, 2009
2092009
Current-assisted thermally activated flux liberation in ultrathin nanopatterned NbN superconducting meander structures
H Bartolf, A Engel, A Schilling, K Il’in, M Siegel, HW Hübers, A Semenov
Physical Review B 81 (2), 024502, 2010
1862010
Ultra-thin NbN films on Si: crystalline and superconducting properties
K Ilin, R Schneider, D Gerthsen, A Engel, H Bartolf, A Schilling, ...
Journal of Physics: Conference Series 97 (1), 012045, 2008
582008
Development of a 60 Deep Trench and Refill Process for Manufacturing Si-Based High-Voltage Super-Junction Structures
H Bartolf, A Mihaila, I Nistor, M Jurisch, B Leibold, M Zimmermann
IEEE transactions on semiconductor manufacturing 26 (4), 529-541, 2013
352013
Robust 3.3 kV silicon carbide MOSFETs with surge and short circuit capability
L Knoll, A Mihaila, F Bauer, V Sundaramoorthy, E Bianda, R Minamisawa, ...
2017 29th International Symposium on Power Semiconductor Devices and IC's …, 2017
332017
Current-induced critical state in NbN thin-film structures
K Il’in, M Siegel, A Engel, H Bartolf, A Schilling, A Semenov, HW Huebers
Journal of Low Temperature Physics 151, 585-590, 2008
292008
Study of 4H-SiC Schottky diode designs for 3.3 kV applications
H Bartolf, V Sundaramoorthy, A Mihaila, M Berthou, P Godignon, J Millan
Materials Science Forum 778, 795-799, 2014
282014
Fluctuation mechanisms in superconductors
H Bartolf
Fluctuation Mechanisms in Superconductors: Nanowire Single-Photon Counters …, 2015
242015
Temperature-and field-dependence of critical currents in NbN microbridges
A Engel, H Bartolf, A Schilling, K Il'in, M Siegel, A Semenov, HW Hübers
Journal of Physics: Conference Series 97 (1), 012152, 2008
222008
Evidence for carbon clusters present near thermal gate oxides affecting the electronic band structure in SiC-MOSFET
D Dutta, DS De, D Fan, S Roy, G Alfieri, M Camarda, M Amsler, ...
Applied Physics Letters 115 (10), 2019
212019
Nanoscale fabrication by intrinsic suppression of proximity-electron exposures and general considerations for easy and effective top–down fabrication
H Bartolf, K Inderbitzin, LB Gómez, A Engel, A Schilling
Journal of Micromechanics and Microengineering 20 (12), 125015, 2010
162010
Fabrication of metallic structures with lateral dimensions less than 15 nm and Jc (T)-measurements in NbN micro-and nanobridges
H Bartolf, A Engel, A Schilling, K Il’in, M Siegel
Physica C: Superconductivity and its applications 468 (7-10), 793-796, 2008
162008
Dopant imaging of power semiconductor device cross sections
U Gysin, E Meyer, T Glatzel, G Günzburger, HR Rossmann, TA Jung, ...
Microelectronic Engineering 160, 18-21, 2016
152016
A novel edge termination for high voltage SiC devices
A Mihaila, VK Sundaramoorthy, R Minamisawa, L Knoll, H Bartolf, ...
2016 28th International Symposium on Power Semiconductor Devices and ICs …, 2016
142016
Hall effect across the quantum phase transition of CeCu6-xAux
H Bartolf, C Pfleiderer, O Stockert, M Vojta, H Löhneysen
Physica B: Condensed Matter 359, 86-88, 2005
132005
Fabrication and characterization of superconducting nanowire highspeed single-photon detectors
H Bartolf
Verlag nicht ermittelbar, 2011
112011
Magnetic vortices in superconducting photon detectors
A Engel, H Bartolf, A Schilling, A Semenov, HW Hübers, K Il'in, M Siegel
Journal of Modern Optics 56 (2-3), 352-357, 2009
102009
Multi-project wafer scale process for productive research and development
H Bartolf, A Engel, L Gómez, A Schilling
Raith Application Note, 2008
92008
Study on transient light emission of SiC power MOSFETs regarding the sensing of source-drain currents in hard-switched power electronic applications
J Winkler, J Homoth, H Bartolf, I Kallfass
PCIM Europe 2019; International Exhibition and Conference for Power …, 2019
82019
Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices
U Gysin, T Glatzel, T Schmölzer, A Schöner, S Reshanov, H Bartolf, ...
Beilstein journal of nanotechnology 6 (1), 2485-2497, 2015
82015
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