| Evaluation of elastic modulus and hardness of thin films by nanoindentation YG Jung, BR Lawn, M Martyniuk, H Huang, XZ Hu Journal of Materials Research 19, 3076-3080, 2004 | 284 | 2004 |
| New concepts in infrared photodetector designs P Martyniuk, J Antoszewski, M Martyniuk, L Faraone, A Rogalski Applied Physics Reviews 1 (4), 2014 | 280 | 2014 |
| Ultrathin tunable terahertz absorber based on MEMS-driven metamaterial M Liu, M Susli, D Silva, G Putrino, H Kala, S Fan, M Cole, L Faraone, ... Microsystems & nanoengineering 3 (1), 1-6, 2017 | 88 | 2017 |
| Stress in low-temperature plasma enhanced chemical vapour deposited silicon nitride thin films M Martyniuk, J Antoszewski, CA Musca, JM Dell, L Faraone Smart materials and structures 15 (1), S29, 2005 | 63 | 2005 |
| MEMS-based tunable Fabry–Perot filters for adaptive multispectral thermal imaging H Mao, KD Silva, M Martyniuk, J Antoszewski, J Bumgarner, BD Nener, ... Journal of Microelectromechanical Systems 25 (1), 227-235, 2016 | 46 | 2016 |
| Effects of deposition temperature on the mechanical and physical properties of silicon nitride thin films BA Walmsley, Y Liu, XZ Hu, MB Bush, KJ Winchester, M Martyniuk, ... Journal of applied physics 98 (4), 2005 | 46 | 2005 |
| Large-area MEMS tunable Fabry–Perot filters for multi/hyperspectral infrared imaging H Mao, DK Tripathi, Y Ren, KD Silva, M Martyniuk, J Antoszewski, ... IEEE Journal of Selected Topics in Quantum Electronics 23 (2), 45-52, 2016 | 44 | 2016 |
| Determining intrinsic stress and strain state of fibre-textured thin films by X-ray diffraction measurements using combined asymmetrical and Bragg-Brentano configurations F Motazedian, Z Wu, J Zhang, BS Shariat, D Jiang, M Martyniuk, Y Liu, ... Materials & Design 181, 108063, 2019 | 32 | 2019 |
| Nanoindentation of HgCdTe prepared by molecular beam epitaxy M Martyniuk, RH Sewell, CA Musca, JM Dell, L Faraone Applied Physics Letters 87 (25), 2005 | 32 | 2005 |
| Uniform dispersion of lanthanum hexaboride nanoparticles in a silica thin film: synthesis and optical properties F Jiang, YK Leong, M Saunders, M Martyniuk, L Faraone, A Keating, ... ACS applied materials & interfaces 4 (11), 5833-5838, 2012 | 30 | 2012 |
| Local bonding environment of plasma deposited nitrogen-rich silicon nitride thin films MTK Soh, N Savvides, CA Musca, MP Martyniuk, L Faraone Journal of applied physics 97 (9), 2005 | 30 | 2005 |
| Environmental stability and cryogenic thermal cycling of low-temperature plasma-deposited silicon nitride thin films M Martyniuk, J Antoszewski, CA Musca, JM Dell, L Faraone Journal of applied physics 99 (5), 2006 | 28 | 2006 |
| Towards MEMS based infrared tunable micro-spectrometers J Antoszewski, J Dell, T Shivakumar, M Martyniuk, K Winchester, ... Proc. SPIE 4935, 148, 2002 | 28 | 2002 |
| Ge/ZnS-based micromachined Fabry–Perot filters for optical MEMS in the longwave infrared H Mao, KD Silva, M Martyniuk, J Antoszewski, J Bumgarner, JM Dell, ... Journal of microelectromechanical systems 24 (6), 2109-2116, 2015 | 26 | 2015 |
| MEMS based hydrogen sensing with parts-per-billion resolution JT Gurusamy, G Putrino, RD Jeffery, KD Silva, M Martyniuk, A Keating, ... Sensors and Actuators B: Chemical 281, 335-342, 2019 | 23 | 2019 |
| Model and analysis of a high sensitivity resonant optical read-out approach suitable for cantilever sensor arrays G Putrino, A Keating, M Martyniuk, L Faraone, J Dell Journal of lightwave technology 30 (12), 1863-1868, 2012 | 22 | 2012 |
| Determination of mechanical properties of silicon nitride thin films using nanoindentation M Martyniuk, J Antoszewski, BA Walmsley, CA Musca, JM Dell, YG Jung, ... Spaceborne Sensors II 5798, 216-225, 2005 | 22 | 2005 |
| Characterization of low-temperature bulk micromachining of silicon using an SF6/O2 inductively coupled plasma F Jiang, A Keating, M Martyniuk, K Prasad, L Faraone, JM Dell Journal of Micromechanics and Microengineering 22 (9), 095005, 2012 | 21 | 2012 |
| Large-area MEMS-based distributed Bragg reflectors for short-wave and mid-wave infrared hyperspectral imaging applications DK Tripathi, H Mao, KD Silva, JW Bumgarner, M Martyniuk, JM Dell, ... Journal of microelectromechanical systems 24 (6), 2136-2144, 2015 | 20 | 2015 |
| Determination of residual stress in low-temperature PECVD silicon nitride thin films MP Martyniuk, J Antoszewski, CA Musca, JM Dell, L Faraone Device and Process Technologies for MEMS, Microelectronics, and Photonics …, 2004 | 20 | 2004 |
