Mattias Klaus Juhl
Mattias Klaus Juhl
Verified email at unsw.edu.au - Homepage
Title
Cited by
Cited by
Year
Photoluminescence and electroluminescence imaging of perovskite solar cells
Z Hameiri, A Mahboubi Soufiani, MK Juhl, L Jiang, F Huang, YB Cheng, ...
Progress in photovoltaics: research and applications 23 (12), 1697-1705, 2015
752015
Outdoor photoluminescence imaging of photovoltaic modules with sunlight excitation
R Bhoopathy, O Kunz, M Juhl, T Trupke, Z Hameiri
Progress in Photovoltaics: Research and Applications 26 (1), 69-73, 2018
602018
Evaluating Crystalline Silicon Solar Cells at Low Light Intensities Using Intensity-Dependent Analysis of I–V Parameters
K Rühle, MK Juhl, MD Abbott, M Kasemann
IEEE Journal of Photovoltaics 5 (3), 926-931, 2015
492015
Calculation of quantitative shunt values using photoluminescence imaging
Y Augarten, T Trupke, M Lenio, J Bauer, JW Weber, M Juhl, M Kasemann, ...
Progress in Photovoltaics: Research and Applications, 2012
372012
Detection of finger interruptions in silicon solar cells using line scan photoluminescence imaging
I Zafirovska, MK Juhl, JW Weber, J Wong, T Trupke
IEEE Journal of Photovoltaics 7 (6), 1496-1502, 2017
322017
Photoluminescence imaging of silicon wafers and solar cells with spatially inhomogeneous illumination
Y Zhu, MK Juhl, T Trupke, Z Hameiri
IEEE Journal of Photovoltaics 7 (4), 1087-1091, 2017
262017
Full Spectrum Photoluminescence Lifetime Analyses on Silicon Bricks
B Mitchell, MK Juhl, MA Green, T Trupke
Photovoltaics, IEEE Journal of 3 (99), 1-8, 2013
232013
The impact of voltage independent carriers on implied voltage measurements on silicon devices
MK Juhl, T Trupke
Journal of Applied Physics 120 (16), 165702, 2016
222016
Extracting metal contact recombination parameters from effective lifetime data
R Dumbrell, MK Juhl, T Trupke, Z Hameiri
IEEE Journal of Photovoltaics 8 (6), 1413-1420, 2018
212018
Module inspection using line scanning photoluminescence imaging
I Zafirovska, MK Juhl, JW Weber, O Kunz, T Trupke
32nd European Photovoltaic Solar Energy Conference and Exhibition (32nd EU …, 2016
212016
Measuring carrier injection from amorphous silicon into crystalline silicon using photoluminescence
A Paduthol, MK Juhl, G Nogay, P Löper, T Trupke
Progress in Photovoltaics: Research and Applications 26 (12), 968-973, 2018
172018
Assessing the performance of surface passivation using low-intensity photoluminescence characterization techniques
CE Chan, MD Abbott, MK Juhl, BJ Hallam, B Xiao, SR Wenham
IEEE Journal of Photovoltaics 4 (1), 100-106, 2013
172013
Comparison of terminal and implied open-circuit voltage measurements
R Dumbrell, MK Juhl, T Trupke, Z Hameiri
IEEE Journal of Photovoltaics 7 (5), 1376-1383, 2017
152017
Reassessments of minority carrier traps in silicon with photoconductance decay measurements
Y Zhu, MK Juhl, G Coletti, Z Hameiri
IEEE Journal of Photovoltaics 9 (3), 652-659, 2019
142019
Correcting the inherent distortion in luminescence images of silicon solar cells
A Teal, M Juhl
2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC), 1-5, 2015
142015
Impact of edge recombination in small-area solar cells with emitter windows
K Rühle, MK Juhl, MD Abbott, LM Reindl, M Kasemann
IEEE Journal of Photovoltaics 5 (4), 1067-1073, 2015
142015
Understanding partial shading effects in shingled PV modules
O Kunz, RJ Evans, MK Juhl, T Trupke
Solar Energy 202, 420-428, 2020
132020
Relative external quantum efficiency of crystalline silicon wafers from photoluminescence
MK Juhl, MD Abbott, T Trupke
IEEE Journal of Photovoltaics 7 (4), 1074-1080, 2017
132017
Anomalously high lifetimes measured by quasi-steady-state photoconductance in advanced solar cell structures
M Juhl, C Chan, MD Abbott, T Trupke
Applied Physics Letters 103 (24), 243902, 2013
132013
Application of the Newton–Raphson method to lifetime spectroscopy for extraction of defect parameters
Y Zhu, QT Le Gia, MK Juhl, G Coletti, Z Hameiri
IEEE Journal of Photovoltaics 7 (4), 1092-1097, 2017
122017
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Articles 1–20