Hamish G Brown
Hamish G Brown
National Centre for Electron Microscopy, Lawrence Berkeley National Laboratory
Verified email at lbl.gov
Cited by
Cited by
Surface determination through atomically resolved secondary-electron imaging
J Ciston, HG Brown, AJ D’Alfonso, P Koirala, C Ophus, Y Lin, Y Suzuki, ...
Nature communications 6 (1), 1-8, 2015
Structure retrieval with fast electrons using segmented detectors
HG Brown, AJ D'Alfonso, Z Chen, AJ Morgan, M Weyland, C Zheng, ...
Physical Review B 93 (13), 134116, 2016
Phase-induced transparency-mediated structured-beam generation in a closed-loop tripod configuration
S Sharma, TN Dey
Physical Review A 96 (3), 033811, 2017
A new method to detect and correct sample tilt in scanning transmission electron microscopy bright-field imaging
HG Brown, R Ishikawa, G Sánchez-Santolino, NR Lugg, Y Ikuhara, ...
Ultramicroscopy 173, 76-83, 2017
Structure retrieval at atomic resolution in the presence of multiple scattering of the electron probe
HG Brown, Z Chen, M Weyland, C Ophus, J Ciston, LJ Allen, SD Findlay
Physical review letters 121 (26), 266102, 2018
Measuring nanometre-scale electric fields in scanning transmission electron microscopy using segmented detectors
HG Brown, N Shibata, H Sasaki, TC Petersen, DM Paganin, MJ Morgan, ...
Ultramicroscopy 182, 169-178, 2017
Secondary electron imaging at atomic resolution using a focused coherent electron probe
HG Brown, AJ D'Alfonso, LJ Allen
Physical Review B 87 (5), 054102, 2013
Probing the effect of electron channelling on atomic resolution energy dispersive X-ray quantification
KE MacArthur, HG Brown, SD Findlay, LJ Allen
Ultramicroscopy 182, 264-275, 2017
Probing the limits of the rigid-intensity-shift model in differential-phase-contrast scanning transmission electron microscopy
L Clark, HG Brown, DM Paganin, MJ Morgan, T Matsumoto, N Shibata, ...
Physical Review A 97 (4), 043843, 2018
A quantum mechanical exploration of phonon energy-loss spectroscopy using electrons in the aloof beam geometry
LJ Allen, HG Brown, SD Findlay, BD Forbes
Microscopy 67 (suppl_1), i24-i29, 2018
Atomic resolution elemental mapping using energy-filtered imaging scanning transmission electron microscopy with chromatic aberration correction
FF Krause, A Rosenauer, J Barthel, J Mayer, K Urban, ...
Ultramicroscopy 181, 173-177, 2017
Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy
HG Brown, R Ishikawa, N Shibata, Y Ikuhara, LJ Allen, SD Findlay
Ultramicroscopy 197, 112-121, 2019
Addressing preservation of elastic contrast in energy-filtered transmission electron microscopy
HG Brown, AJ D'Alfonso, BD Forbes, LJ Allen
Ultramicroscopy 160, 90-97, 2016
py4DSTEM: a software package for multimodal analysis of four-dimensional scanning transmission electron microscopy datasets
BH Savitzky, LA Hughes, SE Zeltmann, HG Brown, S Zhao, PM Pelz, ...
arXiv preprint arXiv:2003.09523, 2020
Linear-scaling algorithm for rapid computation of inelastic transitions in the presence of multiple electron scattering
HG Brown, J Ciston, C Ophus
Physical Review Research 1 (3), 033186, 2019
Advanced Phase Reconstruction Methods Enabled by Four-Dimensional Scanning Transmission Electron Microscopy
C Ophus, TR Harvey, FS Yasin, HG Brown, PM Pelz, BH Savitzky, ...
Microscopy and Microanalysis 25 (S2), 10-11, 2019
Strain fields in twisted bilayer graphene
NP Kazmierczak, M Van Winkle, C Ophus, KC Bustillo, HG Brown, S Carr, ...
arXiv preprint arXiv:2008.09761, 2020
A Python Based Open-source Multislice Simulation Package for Transmission Electron Microscopy
H Brown, P Pelz, C Ophus, J Ciston
Microscopy and Microanalysis, 1-3, 2020
Imaging Low Z Materials in Crystalline Environments Via Scanning Transmission Electron Microscopy
SD Findlay, N Shibata, Y Ikuhara, L Clark, HG Brown, TC Petersen, ...
Microscopy and Microanalysis 25 (S2), 1732-1733, 2019
Quantitative Specimen Electric Potential Maps Using Segmented and Pixel Detectors in Scanning Transmission Electron Microscopy
HG Brown, N Shibata, Z Chen, M Weyland, TC Petersen, DM Paganin, ...
Microscopy and Microanalysis 23 (S1), 442-443, 2017
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