| Surface determination through atomically resolved secondary-electron imaging J Ciston, HG Brown, AJ D’Alfonso, P Koirala, C Ophus, Y Lin, Y Suzuki, ... Nature communications 6, 7358, 2015 | 23 | 2015 |
| Structure retrieval with fast electrons using segmented detectors HG Brown, AJ D'Alfonso, Z Chen, AJ Morgan, M Weyland, C Zheng, ... Physical Review B 93 (13), 134116, 2016 | 16 | 2016 |
| A new method to detect and correct sample tilt in scanning transmission electron microscopy bright-field imaging HG Brown, R Ishikawa, G Sánchez-Santolino, NR Lugg, Y Ikuhara, ... Ultramicroscopy 173, 76-83, 2017 | 12 | 2017 |
| Secondary electron imaging at atomic resolution using a focused coherent electron probe HG Brown, AJ D'Alfonso, LJ Allen Physical Review B 87 (5), 054102, 2013 | 11 | 2013 |
| Measuring nanometre-scale electric fields in scanning transmission electron microscopy using segmented detectors HG Brown, N Shibata, H Sasaki, TC Petersen, DM Paganin, MJ Morgan, ... Ultramicroscopy 182, 169-178, 2017 | 9 | 2017 |
| Probing the effect of electron channelling on atomic resolution energy dispersive X-ray quantification KE MacArthur, HG Brown, SD Findlay, LJ Allen Ultramicroscopy 182, 264-275, 2017 | 7 | 2017 |
| Phase-induced transparency-mediated structured-beam generation in a closed-loop tripod configuration S Sharma, TN Dey Physical Review A 96 (3), 033811, 2017 | 7 | 2017 |
| Structure retrieval at atomic resolution in the presence of multiple scattering of the electron probe HG Brown, Z Chen, M Weyland, C Ophus, J Ciston, LJ Allen, SD Findlay Physical review letters 121 (26), 266102, 2018 | 5 | 2018 |
| A quantum mechanical exploration of phonon energy-loss spectroscopy using electrons in the aloof beam geometry LJ Allen, HG Brown, SD Findlay, BD Forbes Microscopy 67 (suppl_1), i24-i29, 2017 | 5 | 2017 |
| Atomic resolution elemental mapping using energy-filtered imaging scanning transmission electron microscopy with chromatic aberration correction FF Krause, A Rosenauer, J Barthel, J Mayer, K Urban, ... Ultramicroscopy 181, 173-177, 2017 | 5 | 2017 |
| Probing the limits of the rigid-intensity-shift model in differential-phase-contrast scanning transmission electron microscopy L Clark, HG Brown, DM Paganin, MJ Morgan, T Matsumoto, N Shibata, ... Physical Review A 97 (4), 043843, 2018 | 4 | 2018 |
| Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy HG Brown, R Ishikawa, N Shibata, Y Ikuhara, LJ Allen, SD Findlay Ultramicroscopy 197, 112-121, 2019 | 3 | 2019 |
| Addressing preservation of elastic contrast in energy-filtered transmission electron microscopy HG Brown, AJ D'Alfonso, BD Forbes, LJ Allen Ultramicroscopy 160, 90-97, 2016 | 2 | 2016 |
| A linear-scaling algorithm for rapid computation of inelastic transitions in the presence of multiple electron scattering HG Brown, J Ciston, C Ophus arXiv preprint arXiv:1908.07628, 2019 | | 2019 |
| Advanced Phase Reconstruction Methods Enabled by Four-Dimensional Scanning Transmission Electron Microscopy C Ophus, TR Harvey, FS Yasin, HG Brown, PM Pelz, BH Savitzky, ... Microscopy and Microanalysis 25 (S2), 10-11, 2019 | | 2019 |
| Rapid Simulation of Elemental Maps in Core-Loss Electron Energy Loss Spectroscopy HG Brown, SD Findlay, LJ Allen, J Ciston, C Ophus Microscopy and Microanalysis 25 (S2), 574-575, 2019 | | 2019 |
| Pushing the Limits of Absolute Scale Energy Dispersive X-ray Quantification KE MacArthur, SM Collins, HG Brown, SD Findlay, LJ Allen Microscopy and Microanalysis 25 (S2), 968-969, 2019 | | 2019 |
| Structure Retrieval of Strongly Scattering Materials in the Transmission Electron Microscope HG Brown, Z Chen, M Weyland, C Ophus, J Ciston, LJ Allen, SD Findlay Microscopy and Microanalysis 25 (S2), 76-77, 2019 | | 2019 |
| Imaging Low Z Materials in Crystalline Environments Via Scanning Transmission Electron Microscopy SD Findlay, N Shibata, Y Ikuhara, L Clark, HG Brown, TC Petersen, ... Microscopy and Microanalysis 25 (S2), 1732-1733, 2019 | | 2019 |
| Probe Shaping for Quantitative DPC-STEM Using Segmented Detectors L Clark, HG Brown, DM Paganin, MJ Morgan, T Matsumoto, N Shibata, ... Microscopy and Microanalysis 24 (S1), 916-917, 2018 | | 2018 |
