Walid Ibrahim
Walid Ibrahim
Verified email at uaeu.ac.ae
Cited by
Cited by
On the reliability of majority gates full adders
W Ibrahim, V Beiu, MH Sulieman
IEEE Transactions on nanotechnology 7 (1), 56-67, 2008
Using Bayesian networks to accurately calculate the reliability of complementary metal oxide semiconductor gates
W Ibrahim, V Beiu
IEEE Transactions on Reliability 60 (3), 538-549, 2011
Improving solver success in reaching feasibility for sets of nonlinear constraints
W Ibrahim, JW Chinneck
Computers & Operations Research 35 (5), 1394-1411, 2008
A web-based course assessment tool with direct mapping to student outcomes
W Ibrahim, Y Atif, K Shuaib, D Sampson
Educational Technology and Society 18 (2), 46-59, 2015
GREDA: A fast and more accurate gate reliability EDA tool
W Ibrahim, V Beiu, A Beg
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2012
Low-power and highly reliable logic gates transistor-level optimizations
MH Sulieman, V Beiu, W Ibrahim
10th IEEE International Conference on Nanotechnology, 254-257, 2010
On computing nano-architectures using unreliable nano-devices
V Beiu, W Ibrahim, SE Lyshevski
Nano-and Molecular-Electronics Handbook, 1-49, 2007
Optimum reliability sizing for complementary metal oxide semiconductor gates
W Ibrahim, V Beiu, A Beg
IEEE Transactions on Reliability 61 (3), 675-686, 2012
Devices and input vectors are shaping von Neumann multiplexing
V Beiu, W Ibrahim
IEEE transactions on nanotechnology 10 (3), 606-616, 2010
Using the iPad as a pedagogical tool to enhance the learning experince for novice programing students
H Amer, W Ibrahim
2014 IEEE Global Engineering Education Conference (EDUCON), 178-183, 2014
Reliability of NAND-2 CMOS gates from threshold voltage variations
W Ibrahim, V Beiu
2009 International Conference on Innovations in Information Technology (IIT …, 2009
Serial addition: Locally connected architectures
V Beiu, S Aunet, J Nyathi, RR Rydberg, W Ibrahim
IEEE Transactions on Circuits and Systems I: Regular Papers 54 (11), 2564-2579, 2007
A fresh look at majority multiplexing when devices get into the picture
V Beiu, W Ibrahim, S Lazarova-Molnar
2007 7th IEEE Conference on Nanotechnology (IEEE NANO), 883-888, 2007
Gate failures effectively shape multiplexing
V Beiu, W Ibrahim, YA Alkhawwar, MH Sulieman
2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2006
On teaching circuit reliability
A Beg, W Ibrahim
2008 38th Annual Frontiers in Education Conference, T3H-12-T3H-17, 2008
Enabling sizing for enhancing the static noise margins
V Beiu, A Beg, W Ibrahim, F Kharbash, M Alioto
International Symposium on Quality Electronic Design (ISQED), 278-285, 2013
Highly reliable and low-power full adder cell
W Ibrahim, A Beg, V Beiu
2011 11th IEEE International Conference on Nanotechnology, 500-503, 2011
A hands-on approach for teaching denial of service attacks: a case study
Z Trabelsi, W Ibrahim
College of Information Technology, 2013
What von Neumann Did Not Say About Multiplexing Beyond Gate Failures—The Gory Details
V Beiu, W Ibrahim, S Lazarova-Molnar
International Work-Conference on Artificial Neural Networks, 487-496, 2007
On CMOS circuit reliability from the MOSFETs and the input vectors
V Beiu, W Ibrahim
IEEE Workshop on Dependable and Secure Nanocomputing, Estoril/Lisbon, Portugal, 2009
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