Scott David Findlay

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Naoya ShibataThe University of TokyoVerified email at sigma.t.u-tokyo.ac.jp
Ikuhara YUniverfsity of TokyoVerified email at sigma.t.u-tokyo.ac.jp
Adrian D'AlfonsoUniversity of Melbourne School of PhysicsVerified email at dalfonso.com.au
James LeBeauAssociate Professor, Massachusetts Institute of TechnologyVerified email at mit.edu
Stephen PennycookNational University of Singapore (retired)Verified email at utk.edu
Teruyasu MizoguchiInstitute of Industrial Science, The University of TokyoVerified email at iis.u-tokyo.ac.jp
Hamish G BrownIan Holmes Imaging Centre, Bio21 Institute, The University of MelbourneVerified email at unimelb.edu.au
Matthew WeylandAssociate Professor, Monash UniversityVerified email at monash.edu
Yukihito KondoResearcher in JEOL Ltd.Verified email at jeol.co.jp
Zhen ChenInstitute of Physics, Chinese Academy of SciencesVerified email at iphy.ac.cn
Takehito SekiThe University of TokyoVerified email at sigma.t.u-tokyo.ac.jp
Nathan LuggThe University of TokyoVerified email at sigma.t.u-tokyo.ac.jp
Peter NellistProfessor of Materials, University of OxfordVerified email at materials.ox.ac.uk
Gabriel Sánchez-SantolinoDepartment of Materials Physics, Universidad Complutense de Madrid (ORCID: 0000-0001-8036-707X)Verified email at ucm.es
Klaus van BenthemUniversity of California, DavisVerified email at ucdavis.edu
Colin OphusNational Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National LabVerified email at lbl.gov
Timothy PetersenMonash Centre for Electron Microscopy, Monash UniversityVerified email at monash.edu
Maria VarelaUniversidad Complutense MadridVerified email at ucm.es
Benjamin D ForbesUniversity of MelbourneVerified email at unimelb.edu.au
Albina BorisevichOak Ridge National laboratoryVerified email at ornl.gov

Scott David Findlay

Monash University

Verified email at monash.edu - Homepage

Electron diffraction and imaging


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Dynamics of annular bright field imaging in scanning transmission electron microscopy SD Findlay, N Shibata, H Sawada, E Okunishi, Y Kondo, Y Ikuhara Ultramicroscopy 110 (7), 903-923, 2010	489	2010
Quantitative atomic resolution scanning transmission electron microscopy JM LeBeau, SD Findlay, LJ Allen, S Stemmer Physical Review Letters 100 (20), 206101, 2008	451	2008
Differential phase-contrast microscopy at atomic resolution N Shibata, SD Findlay, Y Kohno, H Sawada, Y Kondo, Y Ikuhara Nature Physics 8 (8), 611-615, 2012	431	2012
Robust atomic resolution imaging of light elements using scanning transmission electron microscopy SD Findlay, N Shibata, H Sawada, E Okunishi, Y Kondo, T Yamamoto, ... Applied Physics Letters 95 (19), 2009	412	2009
Spectroscopic imaging of single atoms within a bulk solid M Varela, SD Findlay, AR Lupini, HM Christen, AY Borisevich, N Dellby, ... Physical Review Letters 92 (9), 095502, 2004	398	2004
Two-dimensional mapping of chemical information at atomic resolution M Bosman, VJ Keast, JL Garcia-Munoz, AJ D’Alfonso, SD Findlay, ... Physical Review Letters 99 (8), 086102, 2007	316	2007
Three-dimensional imaging of individual hafnium atoms inside a semiconductor device K van Benthem, AR Lupini, M Kim, HS Baik, SJ Doh, JH Lee, MP Oxley, ... Applied Physics Letters 87 (3), 2005	289	2005
Standardless atom counting in scanning transmission electron microscopy JM LeBeau, SD Findlay, LJ Allen, S Stemmer Nano letters 10 (11), 4405-4408, 2010	258	2010
Position averaged convergent beam electron diffraction: Theory and applications JM LeBeau, SD Findlay, LJ Allen, S Stemmer Ultramicroscopy 110 (2), 118-125, 2010	257	2010
Lattice-resolution contrast from a focused coherent electron probe. Part I LJ Allen, SD Findlay, MP Oxley, CJ Rossouw Ultramicroscopy 96 (1), 47-63, 2003	237	2003
Modelling the inelastic scattering of fast electrons LJ Allen, SD Findlay Ultramicroscopy 151, 11-22, 2015	232	2015
Atomic Structure of a CeO₂ Grain Boundary: The Role of Oxygen Vacancies H Hojo, T Mizoguchi, H Ohta, SD Findlay, N Shibata, T Yamamoto, ... Nano letters 10 (11), 4668-4672, 2010	222	2010
Electric field imaging of single atoms N Shibata, T Seki, G Sánchez-Santolino, SD Findlay, Y Kohno, ... Nature communications 8 (1), 15631, 2017	170	2017
Quantum mechanical model for phonon excitation in electron diffraction and imaging using a Born-Oppenheimer approximation BD Forbes, AV Martin, SD Findlay, AJ D’Alfonso, LJ Allen Physical Review B—Condensed Matter and Materials Physics 82 (10), 104103, 2010	167	2010
Oxygen‐vacancy ordering at surfaces of lithium manganese (III, IV) oxide spinel nanoparticles R Huang, YH Ikuhara, T Mizoguchi, SD Findlay, A Kuwabara, CAJ Fisher, ... Angewandte Chemie International Edition 13 (50), 3053-3057, 2011	161	2011
New area detector for atomic-resolution scanning transmission electron microscopy N Shibata, Y Kohno, SD Findlay, H Sawada, Y Kondo, Y Ikuhara Journal of electron microscopy 59 (6), 473-479, 2010	159	2010
Three-dimensional ADF imaging of individual atoms by through-focal series scanning transmission electron microscopy K van Benthem, AR Lupini, MP Oxley, SD Findlay, LJ Allen, ... Ultramicroscopy 106 (11-12), 1062-1068, 2006	158	2006
Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons R Close, Z Chen, N Shibata, SD Findlay Ultramicroscopy 159, 124-137, 2015	148	2015
Atomic-scale imaging of individual dopant atoms in a buried interface N Shibata, SD Findlay, S Azuma, T Mizoguchi, T Yamamoto, Y Ikuhara Nature Materials 8 (8), 654-658, 2009	148	2009
Direct imaging of reconstructed atoms on TiO2 (110) surfaces N Shibata, A Goto, SY Choi, T Mizoguchi, SD Findlay, T Yamamoto, ... Science 322 (5901), 570-573, 2008	148	2008

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