Vipul Chaudhary

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Subhadeep MukhopadhyayIntel; Former Principal Engineer in TSMC; Former Ph.D. student, Indian Institute Of TechnologyVerified email at intel.com
Souvik MahapatraProfessor, EE Dept, IIT Bombay (Fellow of IEEE, INSA, IASc, INAE)Verified email at ee.iitb.ac.in

Vipul Chaudhary

Department of Electrical Engineering, Indian Institute of Technology Bombay

Verified email at iitb.ac.in


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HKMG process impact on N, P BTI: Role of thermal IL scaling, IL/HK integration and post HK nitridation K Joshi, S Hung, S Mukhopadhyay, V Chaudhary, N Nanaware, ... 2013 IEEE international reliability physics symposium (IRPS), 4C. 2.1-4C. 2.10, 2013	64	2013
Trap generation in IL and HK layers during BTI/TDDB stress in scaled HKMG N and P MOSFETs S Mukhopadhyay, K Joshi, V Chaudhary, N Goel, S De, RK Pandey, ... 2014 IEEE International Reliability Physics Symposium, GD. 3.1-GD. 3.11, 2014	41	2014

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