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Kee Sup Kim
Kee Sup Kim
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Title
Cited by
Cited by
Year
Robust system design with built-in soft-error resilience
S Mitra, N Seifert, M Zhang, Q Shi, KS Kim
Computer 38 (2), 43-52, 2005
7932005
Sequential element design with built-in soft error resilience
M Zhang, S Mitra, TM Mak, N Seifert, NJ Wang, Q Shi, KS Kim, ...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 14 (12 …, 2006
2832006
X-compact: An efficient response compaction technique
S Mitra, KS Kim
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2004
2672004
X-compact: An efficient response compaction technique for test cost reduction
S Mitra, KS Kim
Proceedings. International Test Conference, 311-320, 2002
2582002
Combinational logic soft error correction
S Mitra, M Zhang, S Waqas, N Seifert, B Gill, KS Kim
2006 IEEE International Test Conference, 1-9, 2006
2042006
Delay defect characteristics and testing strategies
KS Kim, S Mitra, PG Ryan
IEEE Design & Test of Computers 20 (5), 8-16, 2003
1342003
XPAND: An efficient test stimulus compression technique
S Mitra, KS Kim
IEEE Transactions on Computers 55 (2), 163-173, 2006
1112006
Scan-based built-in self test (BIST) with automatic reseeding of pattern generator
KS Kim
US Patent 5,574,733, 1996
1101996
Built-in soft error resilience for robust system design
S Mitra, M Zhang, N Seifert, TM Mak, KS Kim
2007 IEEE International Conference on Integrated Circuit Design and …, 2007
1042007
Observing the Sun with the Atacama Large Millimeter/submillimeter Array (ALMA): Fast-scan single-dish mapping
SM White, K Iwai, NM Phillips, RE Hills, A Hirota, P Yagoubov, G Siringo, ...
Solar Physics 292, 1-28, 2017
1002017
Soft error resilient system design through error correction
S Mitra, M Zhang, N Seifert, TM Mak, KS Kim
VLSI-SoC: Research Trends in VLSI and Systems on Chip: Fourteenth …, 2008
982008
Observing the sun with the Atacama large millimeter/submillimeter array (ALMA): high-resolution interferometric imaging
M Shimojo, TS Bastian, AS Hales, SM White, K Iwai, RE Hills, A Hirota, ...
Solar Physics 292, 1-28, 2017
712017
Partial scan by use of empirical testability
KS Kim, CR Kime
1990 IEEE International Conference on Computer-Aided Design, 314,315,316,317 …, 1990
601990
XMAX: X-tolerant architecture for MAXimal test compression
S Mitra, KS Kim
Proceedings 21st International Conference on Computer Design, 326-330, 2003
562003
Comparison of damped oscillations in solar and stellar X-ray flares
IH Cho, KS Cho, VM Nakariakov, S Kim, P Kumar
The Astrophysical Journal 830 (2), 110, 2016
552016
Logic soft errors: a major barrier to robust platform design
S Mitra, M Zhang, TM Mak, N Seifert, V Zia, KS Kim
IEEE International Conference on Test, 2005., 10 pp.-696, 2005
542005
Method and apparatus for multi-frequency, multi-phase scan chain
KS Kim, LJ Schultz
US Patent 5,504,756, 1996
461996
System and shadow circuits with output joining circuit
S Mitra, M Zhang, TM Mak, Q Shi, KS Kim
US Patent 7,278,074, 2007
412007
Design for resilience to soft errors and variations
M Zhang, TM Mak, J Tschanz, KS Kim, N Seifert, D Lu
13th IEEE International On-Line Testing Symposium (IOLTS 2007), 23-28, 2007
412007
Compacting circuit responses
S Mitra, KS Kim
US Patent 7,185,253, 2007
372007
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