Nguyen Cong Dao
Nguyen Cong Dao
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TitleCited byYear
An enhanced MOSFET threshold voltage model for the 6–300 K temperature range
NC Dao, A El Kass, MR Azghadi, CT Jin, J Scott, PHW Leong
Microelectronics Reliability 69, 36-39, 2017
Technology scaling in FPGAs: Trends in applications and architectures
L Shannon, V Cojocaru, CN Dao, PHW Leong
2015 IEEE 23rd Annual International Symposium on Field-Programmable Custom …, 2015
Impact of series resistance on bulk CMOS current matching over the 5–300K temperature range
NC Dao, A El Kass, CT Jin, PHW Leong
IEEE Electron Device Letters 38 (7), 847-850, 2017
Characterisation and Modelling of Bulk CMOS Transistors over the 5–300 K Temperature Range
NC Dao
University of Sydney, 2017
Impact of Series Resistance on Bulk CMOS Current Matching Over the 5&x2013; 300K Temperature Range
NC Dao, A El Kass, CT Jin, PHW Leong
IEEE, 2017
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