David Berney Needleman
Title
Cited by
Cited by
Year
Crystalline silicon photovoltaics: a cost analysis framework for determining technology pathways to reach baseload electricity costs
DM Powell, MT Winkler, HJ Choi, CB Simmons, DB Needleman, ...
Energy & Environmental Science 5 (3), 5874-5883, 2012
3402012
Engineering Solutions and Root-Cause Analysis for Light-Induced Degradation in p-Type Multicrystalline Silicon PERC Modules
K Nakayashiki, J Hofstetter, AE Morishige, TTA Li, DB Needleman, ...
IEEE journal of Photovoltaics 6 (4), 860-868, 2016
1402016
Economically sustainable scaling of photovoltaics to meet climate targets
DB Needleman, JR Poindexter, RC Kurchin, IM Peters, G Wilson, ...
Energy & Environmental Science 9 (6), 2122-2129, 2016
902016
Lifetime spectroscopy investigation of light-induced degradation in p-type multicrystalline silicon PERC
AE Morishige, MA Jensen, DB Needleman, K Nakayashiki, J Hofstetter, ...
IEEE Journal of Photovoltaics 6 (6), 1466-1472, 2016
792016
Evolution of LeTID defects in p-type multicrystalline silicon during degradation and regeneration
MA Jensen, AE Morishige, J Hofstetter, DB Needleman, T Buonassisi
IEEE Journal of Photovoltaics 7 (4), 980-987, 2017
662017
High-performance p-type multicrystalline silicon (mc-Si): Its characterization and projected performance in PERC solar cells
PP Altermatt, Z Xiong, QX He, WW Deng, F Ye, Y Yang, Y Chen, ZQ Feng, ...
Solar Energy 175, 68-74, 2018
252018
Rapid dislocation‐density mapping of as‐cut crystalline silicon wafers
DB Needleman, H Choi1, DM Powell1, T Buonassisi
physica status solidi (RRL)–Rapid Research Letters 7 (12), 1041-1044, 2013
192013
Dislocation-limited performance of advanced solar cells determined by TCAD modeling
DB Needleman, H Wagner, PP Altermatt, Z Xiong, PJ Verlinden, ...
Solar Energy Materials and Solar Cells 158, 29-36, 2016
122016
Assessing the device-performance impacts of structural defects with TCAD modeling
DB Needleman, H Wagner, PP Altermatt, T Buonassisi
Energy Procedia 77, 8-14, 2015
82015
Energy Environ. Sci. 5, 5874 (2012)
DM Powell, MT Winkler, HJ Choi, CB Simmons, DB Needleman, ...
8
Three-dimensional TCAD modeling of grain boundaries in high-efficiency silicon solar cells
DB Needleman, H Wagner, PP Altermatt, T Buonassisi
IEEE Journal of Photovoltaics 6 (4), 817-822, 2016
52016
Sensitivity analysis of optical metrics for spectral splitting photovoltaic systems: A case study
DB Needleman, JP Mailoa, RE Brandt, NM Mangan, T Buonassisi
IEEE Journal of Photovoltaics 5 (5), 1380-1388, 2015
52015
Thin absorbers for defect-tolerant solar cell design
DB Needleman, A Augusto, A Peral, S Bowden, C Del Canizo, ...
2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC), 0606-0610, 2016
32016
Performance limits of silicon solar cells due to structural defects
D Berney Needleman
Massachusetts Institute of Technology, 2016
22016
Optical design guidelines for spectral splitting photovoltaic systems: A sensitivity analysis approach
D Berney Needleman
Massachusetts Institute of Technology, 2014
22014
3-D TCAD Modeling of Grain Boundaries in High-efficiency Silicon Solar Cells
DB Needleman, H Wagner, PP Altermatt, T Buonassisi
under review, 0
2
Understanding Metastable Defect Creation in CIGS by Detailed Device Modeling and Measurements on Bifacial Solar Cells
JW Lee, DB Needleman, WN Shafarman, JD Cohen
MRS Online Proceedings Library (OPL) 1012, 2007
12007
Notice of Removal: Lifetime spectroscopy investigation of light-induced degradation in p-type multicrystalline silicon PERC
AE Morishige, MA Jensen, DB Needleman, K Nakayashiki, J Hofstetter, ...
2017 IEEE 44th Photovoltaic Specialist Conference (PVSC), 1-7, 2017
2017
Characterizing and evaluating the impact of dislocations and grain boundaries on silicon solar cells
DB Needleman, H Wagner, PP Altermatt, Z Xiong, PJ Verlinden, ...
2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC), 3538-3542, 2016
2016
Sensitivity Analysis of Optical Metrics for Spectral Splitting Photovoltaic Systems: A Case Study
D Berney Needleman, JP Mailoa, RE Brandt, NM Mangan, T Buonassisi, ...
Institute of Electrical and Electronics Engineers (IEEE), 2015
2015
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