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Osama O. Awadelkarim
Osama O. Awadelkarim
Professor of Engineering Science and Mechanics, Penn State
Verified email at psu.edu
Title
Cited by
Cited by
Year
Microsensors, MEMS, and smart devices
JW Gardner, VK Varadan, OO Awadelkarim
John Wiley & Sons, Inc., 2003
8122003
Deep‐level transient spectroscopy and photoluminescence studies of electron‐irradiated Czochralski silicon
OO Awadelkarim, H Weman, BG Svensson, JL Lindström
Journal of applied physics 60 (6), 1974-1979, 1986
511986
Impact of polysilicon dry etching on 0.5 μm NMOS transistor performance: the presence of both plasma bombardment damage and plasma charging damage
T Gu, M Okandan, OO Awadelkarim, SJ Fonash, JF Rembetski, P Aum, ...
IEEE electron device letters 15 (2), 48-50, 1994
501994
Free radicals in X-irradiated single crystals of sucrose: a reexamination
E Sagstuen, A Lund, O Awadelkarim, M Lindgren, J Westerling
The Journal of Physical Chemistry 90 (22), 5584-5588, 1986
471986
Extracting the Richardson constant: IrOx/n-ZnO Schottky diodes
K Sarpatwari, OO Awadelkarim, MW Allen, SM Durbin, SE Mohney
Applied physics letters 94 (24), 2009
462009
Microscopic identification and electronic structure of a di-hydrogen–vacancy complex in silicon by optical detection of magnetic resonance
WM Chen, OO Awadelkarim, B Monemar, JL Lindström, GS Oehrlein
Physical review letters 64 (25), 3042, 1990
401990
Photoluminescence study of radiative channels in ion-implanted silicon
OO Awadelkarim, A Henry, B Monemar, JL Lindström, Y Zhang, ...
Physical Review B 42 (9), 5635, 1990
341990
Damage to n-MOSFETs from electrical stress relationship to processing damage and impact on device reliability
L Trabzon, OO Awadelkarim
Microelectronics Reliability 38 (4), 651-657, 1998
321998
Plasma‐charging damage to gate SiO2 and SiO2/Si interfaces in submicron n‐channel transistors: Latent defects and passivation/depassivation of defects by …
OO Awadelkarim, SJ Fonash, PI Mikulan, YD Chan
Journal of applied physics 79 (1), 517-525, 1996
311996
Electrical studies on plasma and reactive‐ion‐etched silicon
A Henry, OO Awadelkarim, JL Lindström, GS Oehrlein
Journal of applied physics 66 (11), 5388-5393, 1989
311989
Electrical properties of contact etched p‐Si: A comparison between magnetically enhanced and conventional reactive ion etching
OO Awadelkarim, PI Mikulan, T Gu, KA Reinhardt, YD Chan
Journal of applied physics 76 (4), 2270-2278, 1994
281994
Effects of barrier height inhomogeneities on the determination of the Richardson constant
K Sarpatwari, SE Mohney, OO Awadelkarim
Journal of Applied Physics 109 (1), 2011
272011
Electronic states created in p‐Si subjected to plasma etching: The role of inherent impurities, point defects, and hydrogen
OO Awadelkarim, T Gu, PI Mikulan, RA Ditizio, SJ Fonash, KA Reinhardt, ...
Applied physics letters 62 (9), 958-960, 1993
271993
Electrical and optical properties of gold‐doped n‐type silicon
H Weman, A Henry, T Begum, B Monemar, OO Awadelkarim, ...
Journal of applied physics 65 (1), 137-145, 1989
271989
On the capacitance of metal/high-k dielectric material stack/silicon structures
J Jiang, OO Awadelkarim, DO Lee, P Roman, J Ruzyllo
Solid-State Electronics 46 (11), 1991-1995, 2002
252002
Trapping site geometry of N2H+4 radical ion in x‐irradiated single crystals of N2H5HC2O4: An ENDOR study
E Sagstuen, O Awadelkarim, A Lund, J Masiakowski
The Journal of chemical physics 85 (6), 3223-3228, 1986
251986
Microfiber inclination, crystallinity, and water wettability of microfibrous thin-film substrates of Parylene C in relation to the direction of the monomer vapor during fabrication
C Chindam, NM Wonderling, A Lakhtakia, OO Awadelkarim, W Orfali
Applied Surface Science 345, 145-155, 2015
242015
A study of iron‐related centers in heavily boron‐doped silicon by deep‐level transient spectroscopy
OO Awadelkarim, B Monemar
Journal of applied physics 64 (11), 6306-6310, 1988
241988
Surface energy of Parylene C
C Chindam, A Lakhtakia, OO Awadelkarim
Materials Letters 153, 18-19, 2015
23*2015
Polycrystalline silicon thin films formed by metal-induced solid phase crystallization of amorphous silicon
YZ Wang, OO Awadelkarim
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 16 (6 …, 1998
221998
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Articles 1–20