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Co-authors
- Yongping LiaoD. Sc.Verified email at dlpu.edu.cn
- Er-Xiong DingTrinity College Dublin, Aalto UniversityVerified email at tcd.ie
- Aqeel HussainUniversity of Eastern FinlandVerified email at uef.fi
- 魏楠 (Nan WEI)Ph.D. Candidate of Physical Electronics, Peking UniversityVerified email at aalto.fi
- Hua JiangAalto UniversityVerified email at aalto.fi
- Patrik LaihoD.Sc.Verified email at aalto.fi
- ying tianAalto universityVerified email at aalto.fi
- Mohammad TavakkoliNanoMaterials Group, Department of Applied Physics, Aalto UniversityVerified email at aalto.fi
- Kimmo MustonenPrincipal Investigator at University of ViennaVerified email at univie.ac.at
- Jani KotakoskiUniversity of Vienna, AustriaVerified email at univie.ac.at
- Nguyen Ngan NguyenPOSTECHVerified email at postech.ac.kr
- Ben McLeanPostdoctoral Research Fellow, Materials modelling and simulation, RMIT UniversityVerified email at rmit.edu.au
- Alister PageThe University of Newcastle, AustraliaVerified email at newcastle.edu.au
- Cristina FloxCIIAEVerified email at ciiae.org
- Sabbir A. KhanSenior Scientist | Danish National Metrology InstituteVerified email at dfm.dk
- Dr. Alina LyuleevaATUMS Associate, TU MunichVerified email at rice.edu
- Albert NasibulinSkolkovo Institute of Science and TechnologyVerified email at skoltech.ru
- Christophe BicharaCentre Interdisciplinaire de Nanoscience de Marseille - CINaM - CNRS and AMUVerified email at cnrs.fr
- Tanja KallioAssociate Professor, Aalto UniversityVerified email at aalto.fi
- Qiang ZhangHonda Research Institute USA, Inc.Verified email at honda-ri.com