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Rajan Singh
Rajan Singh
MLR Institute of Technology, Hyderabad
Verified email at mlrinstitutions.ac.in
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Year
The dawn of Ga2O3 HEMTs for high power electronics-A review
R Singh, TR Lenka, DK Panda, RT Velpula, B Jain, HQT Bui, HPT Nguyen
Materials Science in Semiconductor Processing 119, 105216, 2020
1222020
A novel β‐Ga2O3 HEMT with fT of 166 GHz and X‐band POUT of 2.91 W/mm
R Singh, TR Lenka, RT Velpula, B Jain, HQT Bui, HPT Nguyen
International Journal of Numerical Modelling: Electronic Networks, Devices …, 2021
262021
Simulation modelling of III-nitride/β-Ga2O3 HEMT for emerging high-power nanoelectronics applications
GP Rao, TR Lenka, R Singh, HPT Nguyen
Journal of the Korean Physical Society 81 (9), 876-884, 2022
152022
Operation Principle of AlGaN/GaN HEMT
GP Rao, R Singh, TR Lenka
HEMT Technology and Applications, 105-114, 2022
152022
Performance Analysis of AlGaN/GaN HEMT for RF and Microwave Nanoelectronics Applications
G Purnachandra Rao, R Singh, TR Lenka
HEMT Technology and Applications, 139-153, 2022
122022
Single and double‐gate based AlGaN/GaN MOS‐HEMTs for the design of low‐noise amplifiers: a comparative study
DK Panda, R Singh, TR Lenka, TT Pham, RT Velpula, B Jain, HQT Bui, ...
IET Circuits, Devices & Systems 14 (7), 1018-1025, 2020
122020
Simulation modelling of III‐Nitride/β‐Ga2O3 Nano‐HEMT for microwave and millimetre wave applications
GP Rao, R Singh, TR Lenka, NEI Boukortt, HPT Nguyen
International Journal of RF and Microwave Computer‐Aided Engineering 32 (12 …, 2022
102022
Investigation of E-mode beta-gallium oxide MOSFET for emerging nanoelectronics
R Singh, TR Lenka, RT Velpula, BHQ Thang, HPT Nguyen
2019 IEEE 14th nanotechnology materials and devices conference (NMDC), 1-5, 2019
102019
Optimization of Dynamic Source Resistance in a β-Ga2O3 HEMT and Its Effect on Electrical Characteristics
R Singh, TR Lenka, HPT Nguyen
Journal of Electronic Materials 49, 5266-5271, 2020
72020
Comparative Study of III-Nitride Nano-HEMTs on different substrates for emerging high-power nanoelectronics and millimetre wave applications
G Purnachandra Rao, TR Lenka, R Singh, NEI Boukortt, SM Sadaf, ...
Journal of Electronic Materials 52 (3), 1948-1957, 2023
62023
Analytical modeling of I–V characteristics using 2D Poisson equations in AlN/β-Ga2O3 HEMT
R Singh, TR Lenka, DK Panda, HPT Nguyen, NEI Boukortt, G Crupi
Materials Science in Semiconductor Processing 145, 106627, 2022
62022
Comparative power analysis of CMOS & adiabatic logic gates
H Sharma, R Singh
2015 International Conference on Green Computing and Internet of Things …, 2015
62015
Analytical modeling of dielectric modulated negative capacitance MoS2 field effect transistor for next‐generation label‐free biosensor
DK Panda, TR Lenka, R Singh, V Goyal, NEI Boukortt, HPT Nguyen
International Journal of Numerical Modelling: Electronic Networks, Devices …, 2023
52023
The Effect of Back-Barrier on the Performance Enhancement of III-Nitride/β-Ga2O3 Nano-HEMT
GP Rao, N Baruah, TR Lenka, R Singh, B Nour El I, HPT Nguyen
2022 IEEE International Conference of Electron Devices Society Kolkata …, 2022
52022
Stochastic optimization method for signalized traffic signal systems
D Singh, R Singh
International Journal of Knowledge-Based and Intelligent Engineering Systems …, 2009
52009
Analytical modelling of dielectric modulated negative capacitance MoS2-FET for biosensor application
DK Panda, R Singh, T Lenka, V Goyal, NEI Boukortt, H Nguyen
Authorea Preprints, 2023
42023
Simulation Modeling of AlGaN/AlN/GaN Nano-HEMT on β-Ga2O3 Substrate for Emerging Terahertz Applications
GP Rao, N Baruah, TR Lenka, R Singh, SM Sadaf, HPT Nguyen
2022 IEEE International Conference on Emerging Electronics (ICEE), 1-4, 2022
32022
Breakdown Characteristics Study of III-Nitride/ Nano-HEMT as a function of Field-Plate Length & AlN Nucleation Layer Thickness
GP Rao, TR Lenka, R Singh, B Nour El I, HPT Nguyen, G Crupi
2022 IEEE Calcutta Conference (CALCON), 30-33, 2022
32022
Optimized RTL design of a vending machine through FSM using verilog HDL
P Chidananda Datta, C Vinay Kumar, R Singh, K Mummaneni
Micro and Nanoelectronics Devices, Circuits and Systems: Select Proceedings …, 2022
32022
Investigation of current collapse and recovery time due to deep level defect traps in β-Ga2O3 HEMT
R Singh, TR Lenka, RT Velpula, B Jain, HQT Bui, HPT Nguyen
Journal of Semiconductors 41 (10), 102802, 2020
32020
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