| End-to-end error correction and online diagnosis for on-chip networks S Shamshiri, A Ghofrani, KT Cheng 2011 IEEE International Test Conference, 1-10, 2011 | 93 | 2011 |
| Comprehensive online defect diagnosis in on-chip networks A Ghofrani, R Parikh, S Shamshiri, A DeOrio, KT Cheng, V Bertacco 2012 IEEE 30th VLSI Test Symposium (VTS), 44-49, 2012 | 59 | 2012 |
| A cost analysis framework for multi-core systems with spares S Shamshiri, P Lisherness, SJ Pan, KT Cheng 2008 IEEE International Test Conference, 1-8, 2008 | 41 | 2008 |
| Error-locality-aware linear coding to correct multi-bit upsets in SRAMs S Shamshiri, KT Cheng 2010 IEEE International Test Conference, 1-10, 2010 | 39 | 2010 |
| Yield and cost analysis of a reliable NoC S Shamshiri, KT Cheng 2009 27th IEEE VLSI Test Symposium, 173-178, 2009 | 37 | 2009 |
| Modeling yield, cost, and quality of a spare-enhanced multicore chip S Shamshiri, KT Cheng IEEE Transactions on Computers 60 (9), 1246-1259, 2011 | 33 | 2011 |
| Instruction-level test methodology for CPU core self-testing S Shamshiri, H Esmaeilzadeh, Z Navabi ACM Transactions on Design Automation of Electronic Systems (TODAES) 10 (4 …, 2005 | 19 | 2005 |
| Test instruction set (TIS) for high level self-testing of CPU cores S Shamshiri, H Esmaeilzadeh, Z Navabi 13th Asian Test Symposium, 158-163, 2004 | 11 | 2004 |
| Instruction level test methodology for CPU core software-based self-testing S Shamshiri, H Esmaeilzadeh, Z Navabi Proceedings. Ninth IEEE International High-Level Design Validation and Test …, 2004 | 8 | 2004 |
| Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy S Shamshiri, KT Cheng 2010 28th VLSI Test Symposium (VTS), 194-199, 2010 | 7 | 2010 |
| Post-fabrication reconfiguration for power-optimized tuning of optically connected multi-core systems Y Zheng, P Lisherness, S Shamshiri, A Ghofrani, S Yang, KTT Cheng 17th Asia and South Pacific Design Automation Conference, 615-620, 2012 | 6 | 2012 |
| Hardware accelerator IP-core for wireless 802.16 MAC H Holisaz, S Shamshiri, F Baharvand, SM Fakhraie 2006 IFIP International Conference on Wireless and Optical Communications …, 2006 | 6 | 2006 |
| ISC: Reconfigurable Scan-Cell Architecture for Low Power Testing H Esmaeilzadeh, S Shamshiri, P Saeedi, Z Navabi 14th Asian Test Symposium (ATS'05), 236-241, 2005 | 6 | 2005 |
| Binary Taylor diagrams: An efficient implementation of Taylor expansion diagrams A Hooshmand, S Shamshiri, M Alisafaee, P Lotfi-Kamran, M Naderi, ... 2005 IEEE International Symposium on Circuits and Systems, 424-427, 2005 | 6 | 2005 |
| Test instruction set (TIS): An instruction level CPU core self-testing method S Shamshiri, H Esmaeilzadeh, M Alisafaee, P Lotfikamran, Z Navabi Proceedings of 9th IEEE European Test Symposium (ETS’04), 15-16, 2004 | 4 | 2004 |
| Parallel alias reduction for MP3 decoding S Shamshiri, SM Fakhraie Proceedings. The 16th International Conference on Microelectronics, 2004 …, 2004 | 3 | 2004 |
| Scan Chain Bypass by Use of Skip Path F Fakhrieh, S Shamshiri, A Pedram, A Sobhani, Z Navabi 2005 International Conference on Microelectronics, 82-85, 2005 | 1 | 2005 |
| Interleaved scan-cell architecture for low power test H Esmaeilzadeh, S Shamshiri, P Saeedi, E Ebrahimi, Z Navabi IEEE 5th Workshop on Register Transfer level Test (WRTLT'04), 123-128, 2004 | 1 | 2004 |
| Yield, Cost, Reliability, and Availability of Multi-Core System-on-Chips S Shamshiri University of California, Santa Barbara, 2011 | | 2011 |
| GENETIC-ALGORITHM MEMORY MINIMISATION FOR DESIGNING RECONFIGURABLE IP ADDRESS LOOKUP ENGINE S Shamshiri, SM Fakhraie International Journal of Computational Intelligence and Applications 5 (01 …, 2005 | | 2005 |
Kwang-Ting (Tim) ChengChair Professor of ECE and CSE, HKUSTVerified email at ust.hk
