Chukwuka Madumelu
Chukwuka Madumelu
UNSW Sydney
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Investigation of light-induced degradation in N-Type silicon heterojunction solar cells during illuminated annealing at elevated temperatures
C Madumelu, B Wright, A Soeriyadi, M Wright, D Chen, B Hoex, B Hallam
Solar Energy Materials and Solar Cells 218, 110752, 2020
Firing stability of tube furnace‐annealed n‐type poly‐Si on oxide junctions
C Hollemann, M Rienäcker, A Soeriyadi, C Madumelu, F Haase, ...
Progress in Photovoltaics: Research and Applications 30 (1), 49-64, 2022
Ozone (O3) process technology (OPT): An exploratory brief of minimal ozone discharge applied to shrimp product
COR Okpala, G Bono, A Abdulkadir, CU Madumelu
Energy Procedia 75, 2427-2435, 2015
Evidence for a Light‐Induced Degradation Mechanism at Elevated Temperatures in Commercial N‐Type Silicon Heterojunction Solar Cells
B Wright, C Madumelu, A Soeriyadi, M Wright, B Hallam
Solar RRL 4 (11), 2000214, 2020
Investigating the degradation behaviours of n+-doped Poly-Si passivation layers: An outlook on long-term stability and accelerated recovery
D Chen, C Madumelu, M Kim, BV Stefani, A Soeriyadi, D Kang, HC Sio, ...
Solar Energy Materials and Solar Cells 236, 111491, 2022
Assessing the stability of p+ and n+ polysilicon passivating contacts with various capping layers on p-type wafers
C Madumelu, Y Cai, C Hollemann, R Peibst, B Hoex, BJ Hallam, ...
Solar Energy Materials and Solar Cells 253, 112245, 2023
Impact of firing and capping layers on long-term stability of doped poly-Si passivating contact layers
AH Soeriyadi, C Hollemann, C Madumelu, F Haase, U Römer, R Brendel, ...
AIP Conference Proceedings 2487 (1), 2022
Degradation in next-generation passivating contact solar cells
CU Madumelu
UNSW Sydney, 2023
Impact of Oxide Thickness, Emitter Sheet Resistance, and Polysilicon Doping Concentration on the Passivation Quality and Long-Term Stability of Topcon Solar Cells
C Madumelu, F Bowen, J Genhua, J Bao, S Seunghwan, R Chen, ...
Emitter Sheet Resistance, and Polysilicon Doping Concentration on the …, 0
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