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Co-authors
Abu SebastianDistinguished RSM, IBM Research - ZurichVerified email at zurich.ibm.com
Evangelos EleftheriouIBM Fellow - IBM Research ZurichVerified email at zurich.ibm.com
Leon AbelmannKIST Europe, SaarbrückenVerified email at utwente.nl
Laurent DellmannVerified email at dellmann.org
Federico ZipoliIBM Research - ZurichVerified email at zurich.ibm.com
Alessandro CurioniIBM Fellow - VP Europe and Director - IBM Research ZurichVerified email at zurich.ibm.com
Johan B. C. EngelenArchitect wafer clamping EUV, ASMLVerified email at asml.com
Monica Felicia CraciunProfessor in Nanoscience and Nanotechnology, University of ExeterVerified email at exeter.ac.uk
Tobias Albert BachmannTest and Measurement EngineerVerified email at bodletechnologies.com
Dr. Christophe RosselEmeritus research staff member, IBM Research Zurich,Verified email at zurich.ibm.com
Mark A. LantzIBM Research ZurichVerified email at zurich.ibm.com
Andrea C. FerrariProfessor of Nanotechnology, University of Cambridge, UKVerified email at eng.cam.ac.uk
Arseny M. AlexeevUniversity of ExeterVerified email at exeter.ac.uk
Anna K OttUniversity Lecturer, University of ExeterVerified email at exeter.ac.uk
Daniel KrebsRobert Bosch GmbH, Renningen, GermanyVerified email at de.bosch.com
Albert van den BergMESA+ Institute and BIOS/Lab on a Chip group, University of Twente, the NetherlandsVerified email at utwente.nl
Wouter OlthuisUniversity of TwenteVerified email at home.nl
Chiara MarchioriVerified email at zurich.ibm.com
Haralampos PozidisResearch Manager, IBM Research - ZurichVerified email at zurich.ibm.com
Giorgio ErcolanoExaddon AGVerified email at exaddon.com