Patrick Pons
Patrick Pons
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Cited by
Capabilities and limits of silicon pressure sensors
G Blazquez, P Pons, A Boukabache
Sensors and Actuators 17 (3-4), 387-403, 1989
Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions
U Zaghloul, G Papaioannou, F Coccetti, P Pons, R Plana
Microelectronics Reliability 49 (9-11), 1309-1314, 2009
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation
M Lamhamdi, P Pons, U Zaghloul, L Boudou, F Coccetti, J Guastavino, ...
Microelectronics Reliability 48 (8-9), 1248-1252, 2008
Structure dependent charging process in RF MEMS capacitive switches
E Papandreou, M Lamhamdi, CM Skoulikidou, P Pons, G Papaioannou, ...
Microelectronics Reliability 47 (9-11), 1812-1817, 2007
Charging-effects in RF capacitive switches influence of insulating layers composition
M Lamhamdi, J Guastavino, L Boudou, Y Segui, P Pons, L Bouscayrol, ...
Microelectronics Reliability 46 (9-11), 1700-1704, 2006
Membrane supported Yagi-Uda antennae for millimetre-wave applications
D Neculoiu, P Pons, M Saadaoui, L Bary, D Vasilache, K Grenier, ...
IEE Proceedings-Microwaves, Antennas and Propagation 151 (4), 311-314, 2004
On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization …
U Zaghloul, G Papaioannou, B Bhushan, F Coccetti, P Pons, R Plana
Microelectronics Reliability 51 (9-11), 1810-1818, 2011
Dielectric charging in radio frequency microelectromechanical system capacitive switches: A study of material properties and device performance
G Papaioannou, J Papapolymerou, P Pons, R Plana
Applied Physics Letters 90 (23), 233507, 2007
Novel design of a highly sensitive RF strain transducer for passive and remote sensing in two dimensions
TT Thai, H Aubert, P Pons, G DeJean, MM Tentzeris, R Plana
IEEE Transactions on Microwave Theory and Techniques 61 (3), 1385-1396, 2013
On the influence of environment gases, relative humidity and gas purification on dielectric charging/discharging processes in electrostatically driven MEMS/NEMS devices
U Zaghloul, B Bhushan, P Pons, GJ Papaioannou, F Coccetti, R Plana
Nanotechnology 22 (3), 035705, 2010
Frequency scalable model for MEMS capacitive shunt switches at millimeter-wave frequencies
V Puyal, D Dragomirescu, C Villeneuve, J Ruan, P Pons, R Plana
IEEE Transactions on Microwave Theory and Techniques 57 (11), 2824-2833, 2009
Static response of miniature capacitive pressure sensors with square or rectangular silicon diaphragm
G Blasquez, Y Naciri, P Blondel, NB Moussa, P Pons
Revue de physique appliquée 22 (7), 505-510, 1987
Self-calibrating pressure sensor
P Pons, P Montoriol, P Yameogo
US Patent 8,622,923, 2014
A novel passive wireless ultrasensitive RF temperature transducer for remote sensing
TT Thai, JM Mehdi, H Aubert, P Pons, GR DeJean, MM Tentzeris, R Plana
2010 IEEE MTT-S International Microwave Symposium, 473-476, 2010
Characterisation and modelling of the mismatch of TCRs and their effects on the drift of the offset voltage of piezoresistive pressure sensors
A Boukabache, P Pons, G Blasquez, Z Dibi
Sensors and Actuators A: Physical 84 (3), 292-296, 2000
A wireless passive RCS-based temperature sensor using liquid metal and microfluidics technologies
A Traille, S Bouaziz, S Pinon, P Pons, H Aubert, A Boukabache, ...
2011 41st European Microwave Conference, 45-48, 2011
A systematic reliability investigation of the dielectric charging process in electrostatically actuated MEMS based on Kelvin probe force microscopy
U Zaghloul, GJ Papaioannou, F Coccetti, P Pons, R Plana
Journal of Micromechanics and Microengineering 20 (6), 064016, 2010
Design and realization of high Q millimeter-wave structures through micromachining techniques
B Guillon, D Cros, P Pons, K Grenier, T Parra, JL Cazaux, JC Lalaurie, ...
1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No. 99CH36282 …, 1999
Working principle description of the wireless passive EM transduction pressure sensor
MM Jatlaoui, F Chebila, P Pons, H Aubert
The European Physical Journal-Applied Physics 56 (1), 2011
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques
U Zaghloul, M Koutsoureli, H Wang, F Coccetti, G Papaioannou, P Pons, ...
Microelectronics Reliability 50 (9-11), 1615-1620, 2010
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