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Stanisław H. Nowak
Stanisław H. Nowak
SSRL
Verified email at slac.stanford.edu - Homepage
Title
Cited by
Cited by
Year
Defective carbon-based materials for the electrochemical synthesis of hydrogen peroxide
S Chen, Z Chen, S Siahrostami, TR Kim, D Nordlund, D Sokaras, ...
ACS Sustainable Chemistry & Engineering 6 (1), 311-317, 2018
2582018
Systematic structure–property relationship studies in palladium-catalyzed methane complete combustion
JJ Willis, A Gallo, D Sokaras, H Aljama, SH Nowak, ED Goodman, L Wu, ...
Acs Catalysis 7 (11), 7810-7821, 2017
1642017
Revealing electronic signatures of lattice oxygen redox in lithium ruthenates and implications for high-energy Li-ion battery material designs
Y Yu, P Karayaylali, SH Nowak, L Giordano, M Gauthier, W Hong, R Kou, ...
Chemistry of Materials 31 (19), 7864-7876, 2019
562019
Characterization of ultra-shallow aluminum implants in silicon by grazing incidence and grazing emission X-ray fluorescence spectroscopy
P Hönicke, Y Kayser, B Beckhoff, M Müller, JC Dousse, J Hoszowska, ...
Journal of Analytical Atomic Spectrometry 27 (9), 1432-1438, 2012
472012
First observation of two-electron one-photon transitions in single-photon K-shell double ionization
J Hoszowska, JC Dousse, J Szlachetko, Y Kayser, W Cao, P Jagodziński, ...
Physical review letters 107 (5), 053001, 2011
392011
A versatile Johansson-type tender X-ray emission spectrometer
SH Nowak, R Armenta, CP Schwartz, A Gallo, B Abraham, ...
Review of Scientific Instruments 91 (3), 2020
312020
Sub-pixel resolution with a color X-ray camera
SH Nowak, A Bjeoumikhov, J von Borany, J Buchriegler, F Munnik, ...
Journal of analytical atomic spectrometry 30 (9), 1890-1897, 2015
252015
Grazing angle X-ray fluorescence from periodic structures on silicon and silica surfaces
SH Nowak, D Banaś, W Błchucki, W Cao, JC Dousse, P Hönicke, ...
Spectrochimica Acta Part B: Atomic Spectroscopy 98, 65-75, 2014
242014
EXAFS as a probe of actinide oxide formation in the tender X-ray regime
JG Tobin, SH Nowak, SW Yu, R Alonso-Mori, T Kroll, D Nordlund, ...
Surface Science 698, 121607, 2020
222020
Depth profiling of dopants implanted in Si using the synchrotron radiation based high‐resolution grazing emission technique
Y Kayser, D Banaś, W Cao, JC Dousse, J Hoszowska, P Jagodziński, ...
X‐Ray Spectrometry 41 (2), 98-104, 2012
222012
Depth profiles of Al impurities implanted in Si wafers determined by means of the high-resolution grazing emission X-ray fluorescence technique
Y Kayser, D Banaś, W Cao, JC Dousse, J Hoszowska, P Jagodziński, ...
Spectrochimica Acta Part B: Atomic Spectroscopy 65 (6), 445-449, 2010
222010
Observation of 5f intermediate coupling in uranium x-ray emission spectroscopy
JG Tobin, S Nowak, SW Yu, R Alonso-Mori, T Kroll, D Nordlund, TC Weng, ...
Journal of Physics Communications 4 (1), 015013, 2020
212020
Shading in TXRF: calculations and experimental validation using a color X-ray camera
M Menzel, O Scharf, SH Nowak, M Radtke, U Reinholz, P Hischenhuber, ...
Journal of Analytical Atomic Spectrometry 30 (10), 2184-2193, 2015
212015
Separate measurement of the 5f5/2 and 5f7/2 unoccupied density of states of UO2
JG Tobin, S Nowak, CH Booth, ED Bauer, SW Yu, R Alonso-Mori, T Kroll, ...
Journal of Electron Spectroscopy and Related Phenomena 232, 100-104, 2019
202019
Reproducible, high-dimensional imaging in archival human tissue by multiplexed ion beam imaging by time-of-flight (MIBI-TOF)
CC Liu, M Bosse, A Kong, A Kagel, R Kinders, SM Hewitt, S Varma, ...
Laboratory Investigation 102 (7), 762-770, 2022
182022
Revealing the bonding of solvated Ru complexes with valence-to-core resonant inelastic X-ray scattering
E Biasin, DR Nascimento, BI Poulter, B Abraham, K Kunnus, ...
Chemical Science 12 (10), 3713-3725, 2021
182021
Sulfur Kβ X-ray emission spectroscopy: comparison with sulfur K-edge X-ray absorption spectroscopy for speciation of organosulfur compounds
M Qureshi, SH Nowak, LI Vogt, JJH Cotelesage, NV Dolgova, S Sharifi, ...
Physical Chemistry Chemical Physics 23 (8), 4500-4508, 2021
182021
Depth profiling of low energy ion implantations in Si and Ge by means of micro-focused grazing emission X-ray fluorescence and grazing incidence X-ray fluorescence
Y Kayser, P Hönicke, D Banaś, JC Dousse, J Hoszowska, P Jagodziński, ...
Journal of Analytical Atomic Spectrometry 30 (5), 1086-1099, 2015
182015
Electronic structure of third-row elements in different local symmetries studied by valence-to-core x-ray emission spectroscopy
M Petric, R Bohinc, K Bučar, SH Nowak, M Žitnik, M Kavčič
Inorganic chemistry 55 (11), 5328-5336, 2016
172016
Examples of XRF and PIXE imaging with few microns resolution using SLcam® a color X‐ray camera
SH Nowak, A Bjeoumikhov, J von Borany, J Buchriegler, F Munnik, ...
X‐Ray Spectrometry 44 (3), 135-140, 2015
162015
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