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Co-authors
Ge WangRensselaer Polytechnic InstituteVerified email at rpi.edu- Yanbo ZhangPing An Tech., U.S. Research LaboratoryVerified email at uml.edu
- Yangbo YeProfessor of Mathematics, The University of IowaVerified email at math.uiowa.edu
- Qiong XuStanford UniversityVerified email at stanford.edu
- Guohua CaoVirginia TechVerified email at vt.edu
- Jiang HsiehChief Scientist, GE HealthcareVerified email at med.ge.com
- Bruno De ManManager, CT Systems and Applications Laboratory, GE Global ResearchVerified email at ge.com
- Ming Jiang, PhD., Professor,School of Mathematics, Peking UniversityVerified email at pku.edu.cn
- Deepak BharkhadaSiemens Medical Solutions USA Inc.Verified email at siemens.com
- Wenxiang CongRensselaer Polytechnic InstituteVerified email at rpi.edu
- Otto ZhouUniversity of North CarolinaVerified email at email.unc.edu
- Lei ZhangChair Professor, Dept. of Computing, The Hong Kong Polytechnic UniversityVerified email at comp.polyu.edu.hk
- Eric A. HoffmanProfessor of Radiology, University of IowaVerified email at uiowa.edu
- Alexander KatsevichUniversity of Central Florida and iTomography Corp.Verified email at itomography.com
- Michael Vannierprofessor of radiology, university of chicagoVerified email at uchicago.edu
- Haiou ShenMathWorksVerified email at mathworks.com
- Kriti Sen SharmaSenior Customer Solutions Architect, Paradigm4 Inc.Verified email at vt.edu
- Chuang Miao, Ph.D.Biomedical Engineering, Wake Forest University School of Medicine & VirginiaVerified email at wakehealth.edu
- Jianping LuProfessor of Physics, Applied Science, and Medical ImagingVerified email at email.unc.edu
- Alex OpieUniversity of CanterburyVerified email at pg.canterbury.ac.nz
Hengyong Yu
Verified email at uml.edu - Homepage