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Ge WangRensselaer Polytechnic InstituteVerified email at rpi.edu
Yanbo ZhangPing An Tech., U.S. Research LaboratoryVerified email at uml.edu
Yangbo YeProfessor of Mathematics, The University of IowaVerified email at math.uiowa.edu
Qiong XuStanford UniversityVerified email at stanford.edu
Guohua CaoVirginia TechVerified email at vt.edu
Jiang HsiehChief Scientist, GE HealthcareVerified email at med.ge.com
Bruno De ManManager, CT Systems and Applications Laboratory, GE Global ResearchVerified email at ge.com
Ming Jiang, PhD., Professor,School of Mathematics, Peking UniversityVerified email at pku.edu.cn
Deepak BharkhadaSiemens Medical Solutions USA Inc.Verified email at siemens.com
Wenxiang CongRensselaer Polytechnic InstituteVerified email at rpi.edu
Otto ZhouUniversity of North CarolinaVerified email at email.unc.edu
Lei ZhangChair Professor, Dept. of Computing, The Hong Kong Polytechnic UniversityVerified email at comp.polyu.edu.hk
Eric A. HoffmanProfessor of Radiology, University of IowaVerified email at uiowa.edu
Alexander KatsevichUniversity of Central Florida and iTomography Corp.Verified email at itomography.com
Michael Vannierprofessor of radiology, university of chicagoVerified email at uchicago.edu
Haiou ShenMathWorksVerified email at mathworks.com
Kriti Sen SharmaSenior Customer Solutions Architect, Paradigm4 Inc.Verified email at vt.edu
Chuang Miao, Ph.D.Biomedical Engineering, Wake Forest University School of Medicine & VirginiaVerified email at wakehealth.edu
Jianping LuProfessor of Physics, Applied Science, and Medical ImagingVerified email at email.unc.edu
Alex OpieUniversity of CanterburyVerified email at pg.canterbury.ac.nz
Hengyong Yu
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