Statistical model for random telegraph noise in Flash memories CM Compagnoni, R Gusmeroli, AS Spinelli, AL Lacaita, M Bonanomi, ... IEEE Transactions on electron devices 55 (1), 388-395, 2007 | 138 | 2007 |
NiO as a test case for high resolution resonant inelastic soft x-ray scattering G Ghiringhelli, M Matsubara, C Dallera, F Fracassi, R Gusmeroli, ... Journal of Physics: Condensed Matter 17 (35), 5397, 2005 | 97 | 2005 |
First evidence for injection statistics accuracy limitations in NAND Flash constant-current Fowler-Nordheim programming CM Compagnoni, AS Spinelli, R Gusmeroli, AL Lacaita, S Beltrami, ... 2007 IEEE International Electron Devices Meeting, 165-168, 2007 | 81 | 2007 |
Analytical Model for the Electron-Injection Statistics During Programming of Nanoscale nand Flash Memories CM Compagnoni, R Gusmeroli, AS Spinelli, A Visconti IEEE transactions on electron devices 55 (11), 3192-3199, 2008 | 73 | 2008 |
Ultimate Accuracy for the nand Flash Program Algorithm Due to the Electron Injection Statistics CM Compagnoni, AS Spinelli, R Gusmeroli, S Beltrami, A Ghetti, ... IEEE transactions on electron devices 55 (10), 2695-2702, 2008 | 73 | 2008 |
Defects spectroscopy in SiO2 by statistical random telegraph noise analysis R Gusmeroli, CM Compagnoni, A Riva, AS Spinelli, AL Lacaita, ... 2006 International Electron Devices Meeting, 1-4, 2006 | 46 | 2006 |
A simple method for efficient spike detection in multiunit recordings T Borghi, R Gusmeroli, AS Spinelli, G Baranauskas Journal of neuroscience methods 163 (1), 176-180, 2007 | 45 | 2007 |
A multi-channel low-power IC for neural spike recording with data compression and narrowband 400-MHz MC-FSK wireless transmission A Bonfanti, M Ceravolo, G Zambra, R Gusmeroli, T Borghi, AS Spinelli, ... 2010 Proceedings of ESSCIRC, 330-333, 2010 | 44 | 2010 |
Comparison of modeling approaches for the capacitance–voltage and current–voltage characteristics of advanced gate stacks P Palestri, N Barin, D Brunel, C Busseret, A Campera, PA Childs, ... IEEE Transactions on Electron Devices 54 (1), 106-114, 2006 | 42 | 2006 |
Investigation of the random telegraph noise instability in scaled Flash memory arrays AS Spinelli, CM Compagnoni, R Gusmeroli, M Ghidotti, A Visconti Japanese journal of applied physics 47 (4S), 2598, 2008 | 41 | 2008 |
A multi-channel low-power system-on-chip for single-unit recording and narrowband wireless transmission of neural signal A Bonfanti, M Ceravolo, G Zambra, R Gusmeroli, AS Spinelli, AL Lacaita, ... 2010 Annual International Conference of the IEEE Engineering in Medicine and …, 2010 | 31 | 2010 |
A compact multichannel system for acquisition and processing of neural signals T Borghi, A Bonfanti, G Zambra, R Gusmeroli, AS Spinelli, G Baranauskas 2007 29th Annual International Conference of the IEEE Engineering in …, 2007 | 29 | 2007 |
A power-efficient analog integrated circuit for amplification and detection of neural signals T Borghi, A Bonfanti, R Gusmeroli, G Zambra, AS Spinelli 2008 30th Annual International Conference of the IEEE Engineering in …, 2008 | 28 | 2008 |
Silicon nanocrystal memories: A status update CM Compagnoni, R Gusmeroli, D Ielmini, AS Spinelli, AL Lacaita Journal of Nanoscience and Nanotechnology 7 (1), 193-205, 2007 | 26 | 2007 |
A low-power integrated circuit for analog spike detection and sorting in neural prosthesis systems A Bonfanti, T Borghi, R Gusmeroli, G Zambra, A Oliyink, L Fadiga, ... 2008 IEEE Biomedical Circuits and Systems Conference, 257-260, 2008 | 24 | 2008 |
Statistical investigation of random telegraph noise ID instabilities in Flash cells at different initial trap-filling conditions CM Compagnoni, R Gusmeroli, AS Spinelli, AL Lacaita, M Bonanomi, ... 2007 IEEE International Reliability Physics Symposium Proceedings. 45th …, 2007 | 24 | 2007 |
Valence of under pressure: A resonant inelastic x-ray emission study E Annese, JP Rueff, G Vankó, M Grioni, L Braicovich, L Degiorgi, ... Physical Review B 70 (7), 075117, 2004 | 23 | 2004 |
Intermediate valence behaviour under pressure: how precisely can we probe it by means of resonant inelastic x-ray emission? C Dallera, E Annese, JP Rueff, M Grioni, G Vanko, L Braicovich, A Barla, ... Journal of Physics: Condensed Matter 17 (11), S849, 2005 | 21 | 2005 |
2D QM simulation and optimization of decanano non-overlapped MOS devices R Gusmeroli, AS Spinelli, A Pirovano, AL Lacaita, F Boeuf, T Skotnicki IEEE International Electron Devices Meeting 2003, 9.1. 1-9.1. 4, 2003 | 21 | 2003 |
RTN Instability From the Stationary Trap-Filling Condition: An Analytical Spectroscopic Investigation CM Compagnoni, R Gusmeroli, AS Spinelli, A Visconti IEEE transactions on electron devices 55 (2), 655-661, 2008 | 20 | 2008 |