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Dominique Schryvers
Dominique Schryvers
Full professor, EMAT, Dept. Physics, University of Antwerp
Verified email at uantwerpen.be
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Cited by
Cited by
Year
GP-zones in Al–Zn–Mg alloys and their role in artificial aging
LK Berg, J Gjønnes, VX Hansen, XZ Li, M Knutson-Wedel, D Schryvers, ...
Acta materialia 49 (17), 3443-3451, 2001
8072001
On the mechanism of twin formation in Fe–Mn–C TWIP steels
H Idrissi, K Renard, L Ryelandt, D Schryvers, PJ Jacques
Acta Materialia 58 (7), 2464-2476, 2010
4462010
Transmission electron microscopy investigation of dislocation slip during superelastic cycling of Ni–Ti wires
R Delville, B Malard, J Pilch, P Sittner, D Schryvers
International Journal of Plasticity 27 (2), 282-297, 2011
3412011
Direct observation of ferrielectricity at ferroelastic domain boundaries in CaTiO3 by electron microscopy
S Van Aert, S Turner, R Delville, D Schryvers, G Van Tendeloo, EKH Salje
Advanced Materials 24 (4), 523, 2012
2642012
Microstructure changes during non-conventional heat treatment of thin Ni–Ti wires by pulsed electric current studied by transmission electron microscopy
R Delville, B Malard, J Pilch, P Sittner, D Schryvers
Acta Materialia 58 (13), 4503-4515, 2010
2372010
On the relationship between the twin internal structure and the work-hardening rate of TWIP steels
H Idrissi, K Renard, D Schryvers, PJ Jacques
Scripta Materialia 63 (10), 961-964, 2010
2292010
The influence of surface oxides on the distribution and release of nickel from Nitinol wires
SA Shabalovskaya, H Tian, JW Anderegg, DU Schryvers, WU Carroll, ...
Biomaterials 30 (4), 468-477, 2009
1992009
Quantitative determination of strain fields around Ni4Ti3 precipitates in NiTi
W Tirry, D Schryvers
Acta materialia 53 (4), 1041-1049, 2005
1902005
Neutron-scattering and electron-microscopy studies of the premartensitic phenomena in Ni x Al 100− x alloys
SM Shapiro, BX Yang, Y Noda, LE Tanner, D Schryvers
Physical Review B 44 (17), 9301, 1991
1871991
Microstructure and mechanical properties of Hastelloy X produced by HP-SLM (high power selective laser melting)
ML Montero-Sistiaga, S Pourbabak, J Van Humbeeck, D Schryvers, ...
Materials & Design 165, 107598, 2019
1712019
Unit cell determination in CuZr martensite by electron microscopy and X-ray diffraction
D Schryvers, JW Seo, GS Firstov, YN Koval, J Van Humbeeck
Scripta materialia 36 (10), 1997
1471997
Is there a relationship between the stacking fault character and the activated mode of plasticity of Fe–Mn-based austenitic steels?
H Idrissi, L Ryelandt, M Veron, D Schryvers, PJ Jacques
Scripta Materialia 60 (11), 941-944, 2009
1462009
On the interpretation of high resolution electron microscopy images of premartensitic microstuctures in the Ni-Al β2 Phase
D Schryvers, LE Tanner
Ultramicroscopy 32 (3), 241-254, 1990
1461990
Effect of nanoprecipitates on the transformation behavior and functional properties of a Ti–50.8 at.% Ni alloy with micron-sized grains
X Wang, S Kustov, K Li, D Schryvers, B Verlinden, J Van Humbeeck
Acta Materialia 82, 224-233, 2015
1402015
Microstructure of adiabatic shear bands in Ti6Al4V
J Peirs, W Tirry, B Amin-Ahmadi, F Coghe, P Verleysen, L Rabet, ...
Materials characterization 75, 79-92, 2013
1372013
Transmission electron microscopy study of phase compatibility in low hysteresis shape memory alloys
R Delville, S Kasinathan, Z Zhang, JV Humbeeck, RD James, D Schryvers
Philosophical magazine 90 (1-4), 177-195, 2010
1292010
Fabrication, interface characterization and modeling of oriented graphite flakes/Si/Al composites for thermal management applications
C Zhou, G Ji, Z Chen, M Wang, A Addad, D Schryvers, H Wang
Materials & Design 63, 719-728, 2014
1242014
TEM investigation of the microstructure and defects of CuZr martensite. Part I: Morphology and twin systems
JW Seo, D Schryvers
Acta Materialia 46 (4), 1165-1175, 1998
1191998
Unravelling the multi-scale structure–property relationship of laser powder bed fusion processed and heat-treated AlSi10Mg
P Van Cauwenbergh, V Samaee, L Thijs, J Nejezchlebová, P Sedlak, ...
Scientific reports 11 (1), 6423, 2021
1162021
High-quality sample preparation by low kV FIB thinning for analytical TEM measurements
S Bals, W Tirry, R Geurts, Z Yang, D Schryvers
Microscopy and Microanalysis 13 (2), 80-86, 2007
1112007
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